Abstract:We show that it is possible to reach one of the ultimate goals of organic electronics: producing organic field-effect transistors with trap densities as low as in the bulk of single crystals. We studied the spectral density of localized states in the band gap (trap DOS) of small molecule organic semiconductors as derived from electrical characteristics of organic field-effect transistors or from space-charge-limited-current measurements. This was done by comparing data from a large number of samples including thin-film transistors (TFT's), single crystal field-effect transistors (SC-FET's) and bulk samples. The compilation of all data strongly suggests that structural defects associated with grain boundaries are the main cause of "fast" hole traps in TFT's made with vacuum-evaporated pentacene. For high-performance transistors made with small molecule semiconductors such as rubrene it is essential to reduce the dipolar disorder caused by water adsorbed on the gate dielectric surface. In samples with very low trap densities, we sometimes observe a steep increase of the trap DOS very close (<0.15 eV) to the mobility edge with a characteristic slope of 10-20 meV. It is discussed to what degree band broadening due to the thermal fluctuation of the intermolecular transfer integral is reflected in this steep increase of the trap DOS. Moreover, we show that the trap DOS in TFT's with small molecule semiconductors is very similar to the trap DOS in hydrogenated amorphous silicon even though polycrystalline films of small molecules with van der Waals-type interaction on the one hand are compared with covalently bound amorphous silicon on the other hand.

Current Voltage Characteristics and Excess Noise at the Trap Filling Transition in Polyacenes

Correlation of Traps Inside XLPE and Polypropylene with Space Charge Dynamics under Polarity Reversal Condition

Understanding Thickness-Dependent Charge Transport in Pentacene Transistors by Low-Frequency Noise

$f^{-γ}$ Current Fluctuations in Organic Semiconductors: Evidence for Percolation

Trapping in organic field-effect transistors

Oxygen-related traps in pentacene thin films: Energetic position and implications for transistor performance

Electric-field noise from thermally-activated fluctuators in a surface ion trap

The trap DOS in small molecule organic semiconductors: A quantitative comparison of thin-film transistors with single crystals

An Electron and Hole Trap Energy Distribution Estimation Model and Its Application in Polypropylene Nanocomposites

Estimation of Trap Distribution by the Temperature Spectrum of Space Charge Decay

A Low-Frequency Noise Model with Carrier Generation-Recombination Process for Pentacene Organic Thin-Film Transistor

Transport in organic semiconductors in large electric fields: From thermal activation to field emission

Theory of modified thermally stimulated current and direct determination of trap level distribution

Determination Of Trap Polarity In Conjugated Electroluminescent Polymer By Photoexcitation Thermally Stimulated Current Method

Study of microscopic mechanisms in HAT-CN/NPB interface devices under consideration of trap action

A New Method for Direct Determination of Trap Level Distribution from TSC Measurement

Electron trapping in polyethylene

Charge Trapping in Ferroelectric Polymers

Study on the Basic Capacitance–voltage Characteristics of Organic Molecular Semiconductors

Investigation of electronic trap states in organic photovoltaic materials by current-based deep level transient spectroscopy

Trap Energy Distribution in Polymeric Insulating Materials Through Surface Potential Decay Method