Multiple aging mechanisms in ferroelectric deuterated potassium dihydrogen phosphate

Gregory A. Fields,Samuel F. Cieszynski,Bo Zhao,Kidan A. Tadesse,Mohammed A. Sheikh,Eugene V. Colla,M. B. Weissman
DOI: https://doi.org/10.1063/1.5090764
IF: 2.877
2019-05-21
Journal of Applied Physics
Abstract:The anomalously large dielectric aging in ferroelectric partially deuterated potassium dihydrogen phosphate is found to have multiple distinct mechanisms. Two components cause a decrease in dielectric response over a limited range of fields around the aging field. Substantial aging occurs on time scales of ∼1000 s after a field change, as expected for a hydrogen/deuterium diffusion mechanism. A slower component can give an almost complete loss of domain-wall dielectric response at the aging field after weeks of aging. There is also a particularly unusual aging in which the dielectric response increases with time after rapid cooling.
physics, applied
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