Β Phase Instability in Poly(vinylidene Fluoride/trifluoroethylene) Thin Films Near Β Relaxation Temperature
B. B. Tian,X. F. Bai,Y. Liu,P. Gemeiner,X. L. Zhao,B. L. Liu,Y. H. Zou,X. D. Wang,H. Huang,J. L. Wang,Sh. Sun,J. L. Sun,B. Dkhil,X. J. Meng,J. H. Chu
DOI: https://doi.org/10.1063/1.4913968
IF: 4
2015-01-01
Applied Physics Letters
Abstract:The β phase stability in poly(vinylidene fluoride/trifluoroethylene) [P(VDF-TrFE)] thin films was studied below 300 K using X-ray diffraction and polarization-electric-field (P-E) hysteresis loops measurements. On as-grown samples, an irreversible partial order-disorder transformation at Tβ ∼ 250 K, namely, the β relaxation temperature, was evidenced by the appearance of an additional X-Ray diffraction peak above Tβ as well as changes on the P-E loops on heating after the first cooling. This order-disorder-like transformation which is attributed to an all-trans order to helical disorder transition is suggested to take place in defect-rich regions like crystal-amorphous interphases and/or crystalline areas with randomly distributed TrFE defect-like units.