Regulation NO and NH3 Sensing of Organic Transistors via Synergy of Bias-Stress Effect and Photoexcitation

Guodong Zhao,Yanhong Tong,Qingxin Tang,Yichun Liu
DOI: https://doi.org/10.1109/led.2024.3368143
IF: 4.8157
2024-03-26
IEEE Electron Device Letters
Abstract:Bias-stress effect causing undesirable charge trapping and performance degradation are considered huge obstacles for high-performance organic transistors. Besides the extra effort to suppress it, it is innovative to use the synergy of bias-stress effect and photoexcitation to pre-regulate traps and effectively regulate the response and selectivity of organic transistor to NO and NH3. The transistor-type chemical sensor with bias-stress instability and photo response was fabricated based on a low-crystallinity polymer semiconductor, indacenodithiophene-benzothiadiazole (IDTBT), and unmodified SiO2 dielectric layer. Sensors operated in pre-stressed dark conditions have more hole traps and improve the response to oxidizing NO, which enhanced 2 times than that under light conditions. Under light conditions, the removal of hole traps via photoexcitation facilitates the regeneration of hole trap by reducing NH3, the corresponding response is 1.4 times that of the pre-stressed dark condition.
engineering, electrical & electronic
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