Atomic Origin for Hydrogenation Promoted Bulk Oxygen Vacancies Removal in Vanadium Dioxide

Bowen Li,Min Hu,Hui Ren,Changlong Hu,Liang Li,Guozhen Zhang,Jun Jiang,Chongwen Zou
DOI: https://doi.org/10.1021/acs.jpclett.0c02773
IF: 6.888
2020-11-12
The Journal of Physical Chemistry Letters
Abstract:Oxygen vacancies (V<sub>O</sub>), a common type of point defect in metal oxides materials, play important roles in the physical and chemical properties. To obtain stoichiometric oxide crystal, the pre-existing V<sub>O</sub> is always removed via careful post-annealing treatment at high temperature in an air or oxygen atmosphere. However, the annealing conditions are difficult to control, and the removal of V<sub>O</sub> in the bulk phase is restrained because of the high energy barrier of V<sub>O</sub> migration. Here, we selected VO<sub>2</sub> crystal film as the model system and developed an alternative annealing treatment aided by controllable hydrogen doping, which can realize effective removal of V<sub>O</sub> defects in the VO<sub>2−δ</sub> crystal at a lower temperature. This finding is attributed to the hydrogenation accelerated oxygen vacancies recovery in the VO<sub>2−δ</sub> crystal. Theoretical calculations revealed that the H-doping-induced electrons are prone to accumulate around the oxygen defects in the VO<sub>2−δ</sub> film, which facilitates the diffusion of V<sub>O</sub> and thus makes it easier to be removed. The methodology is expected to be applied to other metal oxides for oxygen-related point defects control.The Supporting Information is available free of charge at <a class="ext-link" href="/doi/10.1021/acs.jpclett.0c02773?goto=supporting-info">https://pubs.acs.org/doi/10.1021/acs.jpclett.0c02773</a>.Thin-film deposition and annealed conditions, hydrogenation and heated treatment, sample characterization, synchrotron-based measurements, and first-principles calculation details (<a class="ext-link" href="/doi/suppl/10.1021/acs.jpclett.0c02773/suppl_file/jz0c02773_si_001.pdf">PDF</a>)This article has not yet been cited by other publications.
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