A novel method for interfacial energy gap determination

Xuehua Zhou,Yushu Chen,Qingxia Li,Shixing Yang,Chao Han
DOI: https://doi.org/10.1038/s41598-024-67987-7
IF: 4.6
2024-07-25
Scientific Reports
Abstract:A precise quantification of energy gap for a molecular semiconductor is crucial. However, there has always been a lack of a suitable method which results in an inaccurate measurement. In this research, a three-terminal vertical structure (Al/AlO X /Au/ molecular semiconductor/Al), named hot electron transistor has been designed to be the most powerful method for energy gap determination. By analysing the I C-hot –V EB curves, the electron injected barrier and hole injected barrier can be extracted. In combination of the both, the energy gap of four objects, including PBDB-T-2Cl, C 60 , PTCDA, and Alq3, has been determined finally.
multidisciplinary sciences
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