Abstract:X-ray detection is widely utilized in our daily life, such as in medical diagnosis, security checking, and environmental monitoring. However, most of the commercial X-ray detectors are based on inorganic semiconductors, e.g., Si, CdTe, and Ge, which require complex and costly fabrication processes. Metal halide perovskites have recently emerged as a set of promising candidates for ionizing radiation detection, owing to the high attenuation coefficient, long carrier lifetime, and excellent charge transport properties. Perovskite single crystals have been successfully implemented in X-ray detection, but the fragile single crystals limit the device fabrication and the integration with a read-out circuit. In addition, it is hard to reach inch-size single crystals for real application. Flexible devices based on perovskite films or composite films have also been reported, but either the thickness or charge transport properties are limited by the solution processes. In this work, we introduced thermal co-evaporation to deposit highly efficient formamidinium lead iodide perovskite films. Considering the trade-off between X-ray absorption and charge transport, we optimized the active layer thickness and achieved large-area and flexible X-ray detectors with state-of-the-art device performance, including extremely low dark current and noise, fast response, and high sensitivity of 142.1 μC Gyair–1 cm–2.The Supporting Information is available free of charge at <a class="ext-link" href="/doi/10.1021/acsami.0c20973?goto=supporting-info">https://pubs.acs.org/doi/10.1021/acsami.0c20973</a>.Photographs of the front and back of a large-area, evaporated perovskite films deposited on the flexible PET substrate; the device performance statistics of perovskite photodiodes; the J–V characteristics of multiple photodiodes and typical EQE spectra of the optimized photodiode; SEM images; the comparison of the sensitivity of the evaporated perovskite X-ray detectors with various thicknesses; the temporal response of the optimized EPXDs with active layer thickness; and the long-term device stability of the optimized EPXDs encapsulated with a cover glass (<a class="ext-link" href="/doi/suppl/10.1021/acsami.0c20973/suppl_file/am0c20973_si_001.pdf">PDF</a>)This article has not yet been cited by other publications.

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