Abstract:Z-contrast imaging in the scanning transmission electron microscope (STEM) is a powerful tool to image precious metal heterogeneous catalysts at the atomic scale. When the annular dark-field (ADF) images from the STEM are quantified onto an absolute scale (Figure 1), it has been shown that it is possible to count the number of atoms in individual atomic columns of metallic nanoparticles and to estimate their three-dimensional structure [1]. In recent years further progress has been made in identifying the possible sources of error in the recording and analysis of quantitative annular dark-field (ADF STEM) images [2], in experiment-design, and in verifying the metrology by tomographic techniques. Of these developments, the move to fast multi-frame image-acquisition and -averaging has enabled the correction of experimental scanning-distortions, reductions in electron beam-damage of samples, and improvements in signal-noise ratio (SNR) [3]. Very recently, a new ADF image analysis best-practice, melding the benefits of both reference-simulation and unbiased statistical interpretation based analysis methods, has produced an atom counting method with even greater robustness [4,5]. Exploiting these recent technical developments, we obtain optimised raw data which is fed into highthroughput image processing tools revealing particle size, atom-counts etc. Unfortunately, our increased analysis throughput merely shifts the investigation bottleneck from data-processing to interpretation. To remedy this, we have developed a computationally-efficient genetic-algorithm based structure solving code (requiring a few tens of CPU hours per structure on a standard desktop PC) to retrieve likely lowenergy 3D particle structures which match the experimental observations.

Workflow Automation of SEM Acquisitions and Feature Tracking

Nanoparticle Characterization by Automated Acquisition and Analysis of Images and EDS Data in the TEM

Recursive Detection and Analysis of Nanoparticles in Scanning Electron Microscopy Images

Performance of high-resolution SEM/EDX systems equipped with transmission mode (TSEM) for imaging and measurement of size and size distribution of spherical nanoparticles

Unobstructed Multiscale Imaging of Tissue Sections for Ultrastructural Pathology Analysis by Backscattered Electron Scanning Microscopy

Advanced Techniques in Automated High Resolution Scanning Transmission Electron Microscopy

Uncertainty-aware particle segmentation for electron microscopy at varied length scales

An integrated platform for high-throughput nanoscopy

High-Throughput, Algorithmic Determination of Nanoparticle Structure from Electron Microscopy Images

Workflow towards automated segmentation of agglomerated, non-spherical particles from electron microscopy images using artificial neural networks

Advanced Detector Signal Acquisition and Electron Beam Scanning for High Resolution SEM Imaging.

Automated Single Particle Detection and Tracking for Large Microscopy Datasets.

a cross-platform application to characterize nanoparticles from super-resolution microscopy images

The advantages of sub-sampling and Inpainting for scanning transmission electron microscopy

Towards scanning nanostructure X‐ray microscopy

High-precision pinpointing of luminescent targets in encoder-assisted scanning microscopy allows high-speed quantitative analysis.

From High-precision Imaging to High-performance Computing: Leveraging ADF-STEM Atom-counting and DFT for Catalyst Nano-metrology

Automated SEM-Guided AFM Scan with Dynamically Varied Scan Speed

Redundant Cross-Correlation for Drift Correction in SEM Nanoparticle Imaging

A New Method for Estimating Nanoparticle Deposition Coverage from a Set of Weak-Contrast SEM Images

Automating 3D Imaging of Inorganic Nanoparticles