Batch Specular Plane Flatness Measurements Based on Phase Measuring Deflectometry
Zhuotong Li,Dongxue Wang,Lei Liu,Xiaodong Zhang
DOI: https://doi.org/10.3390/s24092693
IF: 3.9
2024-04-25
Sensors
Abstract:Flatness is a critical parameter in the manufacturing industry, directly impacting the fit and overall product performance. As the efficiency of manufacturing continues to advance, there is an increasing demand for more accurate and efficient measurement techniques. Existing methods often struggle to strike a balance between precision and efficiency. In response, this article introduces a novel approach that is capable of achieving high-precision and rapid measurements concerning multiple surfaces. By enhancing the traditional phase measuring deflectometry (PMD) method, employing a matching technique based on polar lines and normal vector constraints to address discrete surface measurement challenges, and implementing a plane pre-positioning method to tackle low efficiency in binocular matching and solving, we successfully performed swift and synchronized measurements for a large batch of specular surfaces and obtained the three-dimensional surface profile of each measured surface. Through experimental validation, the method proposed in this paper can perform the batch measurement of specular planes while maintaining high measurement accuracy.
engineering, electrical & electronic,chemistry, analytical,instruments & instrumentation