Quantitative analysis of the electric field in a two-layer mixed structure and its application

Wanjing Tang,Youjun Deng,Juan Wang,Zaiyun Zhang
DOI: https://doi.org/10.3934/ipi.2024007
2024-02-23
Inverse Problems and Imaging
Abstract:This paper is concerned with the quantitative analysis of the electric field perturbation in a two-layer structure, where the inner layer is a rod-shape inclusion and the outer layer is an arbitrary inclusion with normal size. By making use of the layer potential techniques and asymptotic estimates, we quantify the relationship of the perturbed electric field on the geometry of the inclusions. Then we use the aforesaid quantitative result to uniquely recover the rod shape inclusion with only one boundary measurement.
mathematics, applied,physics, mathematical
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