Charge lifetime improvement of the Continuous Electron Beam Accelerator Facility photogun with a biased anode

J. T. Yoskowitz,G. A. Krafft,G. Palacios-Serrano,S. A. K. Wijethunga,J. Grames,J. Hansknecht,C. Hernandez-Garcia,M. Poelker,M. L. Stutzman,R. Suleiman,C. A. Valerio-Lizarraga,S. B. Van Der Geer
DOI: https://doi.org/10.1103/physrevaccelbeams.27.123401
2024-12-05
Physical Review Accelerators and Beams
Abstract:GaAs photocathodes in dc high-voltage photoguns are highly susceptible to ion back-bombardment, which reduces the photocathode quantum efficiency and limits the useful operating lifetime for producing polarized electron beams. This paper demonstrates that applying a small positive bias to the photog... [Phys. Rev. Accel. Beams 27, 123401] Published Tue Dec 03, 2024
physics, particles & fields, nuclear
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