Rapid ellipsometric imaging characterization of nanocomposite films with an artificial neural network

Patrick Kfoury,Yann Battie,Aotmane En Naciri,Michel Voue,Nouari Chaoui
DOI: https://doi.org/10.1364/ol.514616
IF: 3.6
2024-01-24
Optics Letters
Abstract:Patrick Kfoury, Yann Battie, Aotmane En Naciri, Michel Voue, Nouari Chaoui Imaging ellipsometry is an optical characterization tool that is widely used to investigate the spatial variations of the opto-geometrical ... [Opt. Lett. 49, 574-577 (2024)]
optics
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