Abstract:Optical multilayer thin films have a wide range of applications due to their ability to manipulate transmissive or reflective wavelengths by adjusting the thickness of composed layers, enabling diverse uses. Although their light weight, flexible nature and ease of fabrication position them as promising components for future devices, determining their optimal layer thickness for the desired functionality demands extensive simulations, leading to inefficient utilization of computational resources and time. To overcome these challenges, inverse design methods, leveraging machine learning and deep learning, are being explored. However, these methods necessitate learning processes, despite the presence of well-established formulas that elucidate these phenomena. Furthermore, deriving accurate answers for conditions not included in the learning process proves to be challenging. This paper introduces an innovative inverse design approach that utilizes the backpropagation of a networked transfer matrix, effectively explaining the characteristics of optical multilayer thin films. By exploiting the chain rule of the network, this method calculates gradients to discern how each layer thickness influences the outcomes. Consequently, the optimal thickness is determined without the need for an additional learning process. Mathematical elucidation of the operational principle of this approach is precisely described. Optimization of computing resource utilization through network configuration reduces the calculation time compared to conventional methods. The efficacy of this method is demonstrated through its application in the inverse design of transmissive and reflective films, verifying its potential for enhancing efficiency and accuracy in optical multilayer thin-film design and manufacturing processes.

Evaluation of Chracteristic of Optical Thin Film By Neural Network System

Estimation of Optical Constants of Thin Film by the Use of Artificial Neural Networks.

Optical Analog Computing Devices Designed by Deep Neural Network

Countering Variations and Thermal Effects for Accurate Optical Neural Networks.

Thin-film Neural Networks for Optical Inverse Problem

Evaluation of optical constants in oxide thin films using machine learning

In-process measurement of grinding workpiece surface quality based on neural network

An Artificial Neural Network Model for Accurate and Efficient Optical Property Mapping from Spatial-Frequency Domain Images.

Artificial Neural Network Compensation for an Optical Fiber Temperature Sensing System Based on Optical Time Offset

A Lightweight Neural Network for Spectroscopic Ellipsometry Analysis

Generic characterization method for nano-gratings using deep-neural-network-assisted ellipsometry

Artificial neural network to estimate the refractive index of a liquid infiltrating a chiral sculptured thin film

All-optical neural network with nonlinear activation functions

Optical Parameters Analysis Of A Semi-Conductive Film Based On Genetic Algorithm

Optical Film Damage Classification Based on Neural Network

Efficient inverse design of optical multilayer nano-thin films using neural network principles: backpropagation and gradient descent

Nonlinear Absorption of 2D Materials and Their Application in Optical Neural Networks

Free-space optical neural network based on thermal atomic nonlinearity

Machine Learning Assisted Classification of Aluminum Nitride Thin Film Stress via In-Situ Optical Emission Spectroscopy Data

Determining Thin Film Thickness Characterization Using Adaptive Simulated Annealing Algorithm

Application of artificial neural network to determine the thickness profile of thin film