3D-IC In-Design Thermal Analysis and Optimization

Li Lu,Jinbiao Zhu,Yixing Li,Anand Nagarajan,Jarod Liu,Shin-Yu Shiau,Xin Ai
DOI: https://doi.org/10.1109/itherm55375.2024.10709572
2024-01-01
Abstract:The three-dimensional integrated circuit (3D-IC) technology can offer efficiency, power, and performance in packaging. As part of the system-level endeavor to fully support the application of this technology, we have designed and implemented the next-generation 3D-IC thermal analysis workflow. It features generic fully heterogeneous integration, customizable connection types and bump distribution, automatic meshing, and transient and stress simulation capabilities. This workflow can perform thermal analysis from the level of a single die, to a package complete with a board.Additionally, this workflow has great potential for in-design optimization. We have conducted experiments with a machine learning based tool to optimize physical parameters in a stacking. This thermal workflow can be used for pre-layout suggestion, post-layout optimization, and TSV distribution optimization in 3D-IC designs. The stress simulation has also be enabled in this solver, further providing the capability to perform optimization analysis based on stress simulation targets.
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