Active Machine Learning for Automatic High-Frequency EMI Source Localization

Jinghai Guo,Ling Zhang,Xin Yan,Hanzhi Ma,Da Li,Er-Ping Li
DOI: https://doi.org/10.1109/emcsipi49824.2024.10705449
2024-01-01
Abstract:This paper proposes a sparse emission source microscopy (ESM) technique based on active machine learning to localize high-frequency electromagnetic interference (EMI) sources. The proposed method, which combines the query-by-committee (QBC) algorithm and a newly proposed entropy feedback (EF) technique, can significantly improve the efficiency of high-frequency EMI source location by reducing the number of scanning points. The results of simulation and measurement examples show that the proposed method is much more time-efficient compared with the full sampling method. Also, the method demonstrates a noticeable advantage over the uniform sampling and random sampling approaches, and has higher accuracy of EMI source location with the same number of sparse scanning samples.
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