Application of Deep Learning in Near Field of EMI Scanning

Dong-Hao Han,Xing-Chang Wei
DOI: https://doi.org/10.1109/aces-china62474.2024.10699607
2024-01-01
Abstract:In this paper, we present a brief summary of two implementations of deep learning in the field of near-field scanning technology for electromagnetic interference (EMI), specifically focusing on the near field to near field transformation and near field to far field transformation. Sufficient data is acquired through a randomly distributed dipoles array for deep learning training purposes. These two applications demonstrate significant potential in the EMI domain and offer innovative solutions for addressing EMI challenges.
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