From Beam Damage to Massive Reaction Amplification Under the Electron Microscope: An Ionization-Induced Chain Reaction in Crystals of a Dewar Benzene

Miguel A. Garcia-Garibay,Krzysztof Konieczny,Indrajit Paul,Jose Rodriguez
DOI: https://doi.org/10.26434/chemrxiv-2024-50693
2024-08-19
Abstract:Electron microscopy and electron diffraction are powerful imaging and structural elucidation methods where sample information is generally limited by random chemical and structural damage. Here we show how a well-selected chemical probe can be used to transform indiscriminate chemical damage into clean chemical processes that can be used to characterize some aspects of the interactions between high energy electron beams and soft organic matter. Crystals of a Dewar benzene exposed to a 300 keV electron beam facilitate a clean valence-bond isomerization radical-cation chain reaction where the number of chemical events per incident electron is amplified by a factor of up to ca. 90,000.
Chemistry
What problem does this paper attempt to address?
The paper aims to address the issue of chemical and structural damage caused by electron microscopy (especially cryo-electron microscopy) when observing organic and biological materials. Specifically, the authors propose a method to transform random chemical damage into controllable chemical processes through carefully designed chemical probes, thereby better understanding the interaction between high-energy electron beams and soft organic matter. The core content of the research involves using Dewar benzene crystals to initiate valence bond isomerization radical cation chain reactions under electron beam irradiation. This chain reaction can significantly amplify the number of chemical events triggered by each incident electron, by up to approximately 90,000 times. Additionally, the paper explores the reaction efficiency under different conditions (such as temperature, electron beam intensity, and energy) and presents microcrystal electron diffraction (micro-ED) experimental results conducted under low-dose conditions, revealing the extreme fragility differences of samples with the same chemical composition. These findings provide new insights into understanding and mitigating electron beam-induced degradation mechanisms and may potentially position electron microscopy as a new tool for chemical synthesis.