Abstract:X-ray detection is widely used in research[1−3], product inspection[4], nuclear station, and medical imaging. Si[5], α-Se[6], PbI2, and CdZnTe[8] are conventional semiconductors, and some problems limit their applications. For instance, Si and αSe have low stopping power for X-ray[8], which hinders their application in high-energy range over 50 keV. Moreover, the complicated preparation, high operating voltage, and high fabrication cost of these materials are the negative issues. Perovskite materials are promising candidates for X-ray detection due to facile synthesis[9−14] and large mobility-lifetime (μτ) products for highly sensitive detection. The μτ product of MAPbBr3 single crystal reaches 1.2 × 10–2 cm2 V–1[12], which is comparable to the μτ value of CdZnTe[3]. Perovskitebased X-ray detectors also exhibited a record X-ray sensitivity[15] of ~710 000 μC Gy–1 cm–2 and an ultralow detection limit[16] of 0.62 nGy s–1. Tang et al. developed a hot-pressing method to grow quasi-monocrystalline CsPbBr3 films, which exhibits a superior sensitivity of 55 684 μC Gy–1 cm–2 and a low detection limit of 215 nGy s–1[17]. To date, halide perovskites in various forms like polycrystalline films, single crystals, and nanocrystals have been used in X-ray detectors. Especially, polycrystalline films prepared by hot-pressing, coating or printing have attracted great interests due to their superior flexibility, lightweight and facile synthesis. In comparison to brittle single-crystal films, polycrystalline films can be curved to fit non-flat substrates, thus showing potential for flexible X-ray detectors[18, 19]. Some high-quality flexible perovskite films were prepared, presenting high performance. Liu et al.[20] reported a flexible and printable Xray detector based on colloidal CsPbBr3 QDs. To enhance the sensitivity, they effectively reduced the surface defects and tuned crystallinity via chemical engineering. This detector can sense a very low X-ray dose rate (~17.2 μGy s–1) with a high sensitivity of 1450 μC Gy–1 cm–2 at 0.1 V bias. Meanwhile, the vignetting issues can be effectively alleviated, leading to reduced misdiagnosis. 400 cm2 MAPb(I0.9Cl0.1)3filled nylon membranes were used to make X-ray detectors[21]. The devices exhibited a high sensitivity of ~8696 μC Gy–1 cm–2 and could be bent at 2 mm radius without performance loss (Figs. 1(a)–1(d)). For polycrystalline films, besides flexibility, the facile preparation of large-area and thick films by solution processing is another advantage over single crystal films. Blade coating is one of the common methods. Kim et al.[22] made a thick polycrystalline MAPbI3 film by this method, and it had excellent optoelectronic properties, which are comparable to single crystal films. The device had a thickness of 830 μm and an active area of ~100 cm2 (Figs. 1(e)–1(g)). In order to minimize dark current drift, the polycrystalline films should have high crystallinity and large grain to reduce grain boundaries. He et al.[23] made a quasi-2D perovskite film with low defects and suppressed ion migration. The average grain size was 31.88 μm. Such large grain size resulted from colloidal particles aggregating in the slurry with PEA+, which can decrease nucleation sites. The resulted μτ value was 2.6 × 10–5 cm2 V–1 and the minimum current drift was 1.5 × 10–2 pA cm–1 s–1 V–1. The perovskite films should give low dark current to ensure high X-ray sensitivity. The patients under a high level of radiation exposure may face cancer risk[24]. To capture clear X-ray images under a low dose of X-ray is desired[25]. The detection limit is the minimum signal which can be reliably identified by X-ray detectors and is defined as the equivalent dose rate of a signal 3 times greater than the noise. A low detection limit results from high current signal with low noise current dominated by dark current, which can reduce the imaging capability of detectors under weak X-ray. Most polycrystalline perovskite detectors[17, 26] have large dark current densities of 50–500 nA cm–2 under an electrical field of 0.05 V μm–1 due to the defective structures as compared to single crystals. To solve this problem, great efforts have been devoted to improve the quality of perovskite films. Zhou et al.[27] reported a heterojunction structure formed by laminating membranes filled with perovskites with different bandgaps. The membranes reduced dark current density of the devices by over 200 times without compromising their sensitivity. They captured clear X-ray images at a low dose rate of 32.2 nGy s–1 (Figs. 2(a)–2(c)). Tang et al.[23] also proposed a new strategy to suppress ion migration by inserting 2D Ruddlesden-Popper layer into 3D perovskite film. The quasi-2D perovskite Xray detector offered a sensitivity of 10 860 μC Gy–1 cm–2 with a stable dark current. Generally, perovskite films should have a thickness of hundreds micrometers for sufficient X-ray absorption[28]. However, it is very difficult to make such films by spin-coating or blade-coating methods. First, it is difficult to deposit a very thick wet film due to the limitations of surface tension and viscosity[29]. Second, even though a thick wet film could be made, it is still difficult to obtain perovskite films with high crystallinity and low defect density (Figs. 2(d) and 2(f)).

Transparent Perovskite Wafers Via Nanocrystals Ordered Coalescence Toward Sensitive and Stable X-Ray Detection and Imaging

Aging CsPbBr3 Nanocrystal Wafer for Ultralow Ionic Migration and Environmental Stability for Direct X-ray Detection.

Large and Dense Organic-Inorganic Hybrid Perovskite CH3NH3PbI3 Wafer Fabricated by One-Step Reactive Direct Wafer Production with High X-ray Sensitivity.

Polycrystalline hybrid perovskite with enhanced ordered crystal domains for sensitive X-ray detection

Mechanical polishing with chemical passivation of perovskite single crystal for high-performance X-ray detector

Ultrasound‐Assisted Crystallization Enables Large‐Area Perovskite Quasi‐Monocrystalline Film for High‐Sensitive X‐ray Detection and Imaging

Perovskite Films for X-ray Detection

High-Quality Single Crystal Perovskite for Highly Sensitive X-Ray Detector

High-performance single crystal CH 3 NH 3 PbI 3 perovskite x-ray detector

High-performance Single Crystal CH3NH3PbI3 Perovskite X-Ray Detector

Suppression of Ionic and Electronic Conductivity by Multilayer Heterojunctions Passivation Toward Sensitive and Stable Perovskite X‐Ray Detectors

Liquid-Phase Epitaxial Growth of Large-Area MAPbBr 3– n Cl n /CsPbBr 3 Perovskite Single-Crystal Heterojunction for Enhancing Sensitivity and Stability of X-ray Detector

Controllable Growth of High Quality MAPbX 3 Perovskite Single Crystals for X-ray Detection

Balance Lead in Solution-Processed CH3NH3PbBrxCl(3−x) Single Crystals for High Performance X-ray Detection

Lattice‐Gradient Perovskite KTaO3 Films for Ultra‐Stable and Low‐Dose X‐Ray Detector

Sensitive X-ray Detectors Made of Methylammonium Lead Tribromide Perovskite Single Crystals

Wafer-Scale Photolithography-Pixeled Pb-Free Perovskite X-ray Detectors.

Steady‐State Inverse‐Temperature Crystallization Enabling Low Defect Perovskite Single Crystal and Efficient X‐Ray Detectors

Eu2+‐doped MAPbBr3 Perovskite Nanocrystal in Silica Composites with Enhanced Stability for White Light Emission and Flexible X‐Ray Detectors

Water-assisted Mass Preparation of CsPbBr3-CsPb2Br5-CsPbIxBr3-x Composite Wafers for High-Performance X-ray Detection

High Sensitivity X-Ray Detectors with Low Degradation Based on Deuterated Halide Perovskite Single Crystals