A 266F2 Ultra Stable Differential NOR-Structured Physically Unclonable Function with < 6× 10-9 Bit Error Rate Through Efficient Redundancy Strategy

Haoyi Zhang,Jiahao Song,Haoyang Luo,Xiyuan Tang,Yuan Wang,Runsheng Wang,Ru Huang
DOI: https://doi.org/10.1109/tcsii.2024.3433543
2024-01-01
IEEE Transactions on Circuits & Systems II Express Briefs
Abstract:This letter presents a NOR-structured physically unclonable function (PUF) tailored for low-cost Internet of Things (IoT) applications. The proposed NOR-structured PUF utilizes a single minimum-sized differential NMOS pair, capitalizing on threshold-voltage mismatch as the entropy source. Fabricated in 65nm CMOS, the basic PUF cell is a 58F2 differential NMOS pair, demonstrating a raw bit error rate (BER) of 0.31%. To further enhance the stability and achieve an ultralow BER, we introduce an area-efficient redundancy strategy. By incorporating 4x redundancy cells (266F2 in total), the prototype chip achieves an ultra-low BER (zero error in 20M bits), over a wide temperature range (-20 to 125° C) and supply voltage variations (0.8 to 1.2V). The core energy consumption is only 63fJ/bit, offering a low-cost and highly stable solution for IoT applications.
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