Beam Coupling Impedance Measurement Based on Goubau Line Method

Sen Yue,Na Wang,Saike Tian,Jintao Li,Lihua Huo,Tianmu Xin,Jiuqing Wang,Gang Xu,Yi Jiao,Ping He
DOI: https://doi.org/10.1016/j.nima.2024.169631
2024-01-01
Abstract:The Goubau line method has been recently proposed and used for the longitudinal beam coupling impedance measurement of vacuum components. To extend the application of this method, the measurement of transverse impedance using the Goubau line method is proposed in this work. The feasibility of measuring the transverse impedance using the Goubau line method has been tested using a pillbox cavity. Additionally, the frequency shift induced by the dielectric-coated wire in the Goubau line measurements has been investigated analytically. The contribution of the dielectric coating to the frequency shift has been studied. Finally, the Goubau line setup has been optimized and used to evaluate the longitudinal and transverse beam coupling impedance key vacuum components in the High Energy Photon Source.
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