Research on Insulation Defect Detection Method for Conductive Slip Rings Based on MEMS Sensors

Yang,He Li,Yitong Yao,Haibao Mu,Guangqian Niu,Chengshan Liu,Zhiyuan Qian
DOI: https://doi.org/10.1109/cieec60922.2024.10583693
2024-01-01
Abstract:The insulation reliability of the space conductive slip ring (SR) is crucial for ensuring the safe electrical transmission of satellites. Currently, the lack of monitoring and warning operation mode in SR makes it challenging to meet the long-life, high-power development needs of future spacecraft. Using the finite element simulation (FES) method, this paper investigates the effects of electrode deformation defects and brush attachment defects on the surface electric field of the SR. The results indicate that defects located near the main insulation of the SR will cause significant distortion in the surface electric field. Furthermore, the optimal detection location was determined based on the peak value of the distorted electric field. Subsequently, the selected MEMS sensors were calibrated and tested for accuracy, with an error of less than 0.5 kV/m in the test range of 0–20 kV/m. Using the sensor, the surface electric field of an SR operated with electricity and containing defects was tested. The radiation range of the distorted electric field caused by the defects was investigated, and the influence of voltage level on the defect detection effect was further studied. The results demonstrate that, at a 300V SR voltage, the sensor effectively identifies defects when the distance is less than 3mm from the SR surface. At a detection distance of 1 mm, the sensor can effectively detect established defects at standard voltage levels. This paper provides guidance for the future application of MEMS electric field sensors in the space domain.
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