Hybrid Fast Modeling of Via-Connected Traces in Multilayer Electronic Packages

Ruifeng Xu,Da Li,Er-Ping Li
DOI: https://doi.org/10.23919/emcjapan/apemcokinaw58965.2024.10585128
2024-01-01
Abstract:Signal conversion between different layers of high-speed interconnect links will cause serious noise and crosstalk problems. This paper presents a hybrid fast modeling approach to efficiently analyze the port conversion of via-connected microstrip and strip lines in multilayer electronic package structures. The results indicate that our method can efficiently analyze the transmission and crosstalk parameters of via-connected traces. Further, the impact of different ground via layouts is presented, which demonstrates a prospect for automatic optimization design.
What problem does this paper attempt to address?