Voltage Linearity Modulation and Polarity Dependent Conduction in Metal-Insulator-metal Capacitors with Atomic-Layer-deposited Al2O3/ZrO2/SiO2 Nano-Stacks

Bao Zhu,Wenjun Liu,Wei Lei,David Wei Zhang,Anquan Jiang,Shi‐Jin Ding
DOI: https://doi.org/10.1063/1.4923349
IF: 2.877
2015-01-01
Journal of Applied Physics
Abstract:Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation Bao Zhu, Wen-Jun Liu, Lei Wei, David Wei Zhang, Anquan Jiang, Shi-Jin Ding; Voltage linearity modulation and polarity dependent conduction in metal-insulator-metal capacitors with atomic-layer-deposited Al2O3/ZrO2/SiO2 nano-stacks. J. Appl. Phys. 7 July 2015; 118 (1): 014501. https://doi.org/10.1063/1.4923349 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioJournal of Applied Physics Search Advanced Search |Citation Search
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