Graph Representation Learning and Optimization for Spherical Emission Source Microscopy System

Xiaorui Liu,Zijie Li,Weihua Zong,Hang Su,Peng Liu,Shuzhi Sam Ge
DOI: https://doi.org/10.1109/tase.2024.3375024
IF: 6.636
2024-01-01
IEEE Transactions on Automation Science and Engineering
Abstract:Emission source microscopy (ESM) technique can be utilized for the localization of electromagnetic interference (EMI) sources in electronic systems, its performance greatly depends on the scanner accuracy and back-propagation method. In this paper, we introduce a novel spherical ESM system driven by 6-DOF manipulator, and investigate the back-propagation based on sphere wave expansion and robot control strategy. For spherical scanning aperture, we fuse the robot kinematics model and measurement constraints, and propose solving the optimal scanning grid with nonlinear programming method. For manipulator control, we present a graph-based learning framework (Gash-LKH) that combines sparse graph neural network with Lin-Kernighan heuristic (LKH) solver. This framework adopts the gated single-head attention module and parallel sparse graph feature abstracting channels, it can produce high-qualified edge candidate set that help subsequent LKH solver generate optimal scanning path with lower memory cost and less computation. Extensive experiments are conducted to validate the performance of Gash-LKH and Spherical ESM system, the results have demonstrated the feasibility and superiority of spherical ESM system in providing accurate microscopy and localization in EMI measurement.
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