Crystal Structure and Microwave Dielectric Property of Xmgo-Sio2 (x = 1~2) System for 5G Applications
Yan Wang,Jiajing Li,Haipeng Zhu,Qilei Wang,Tulai Sun,Tao Ni,Yanghong Lin,Yu Liu,Minmin Mao,Ji Hu,Bing Liu,Hadi Barzegar Bafrooei,Zhongyan Ma,Yingjie Ren,Feng Shi,Ehsan Taheri-Nassaj,Dawei Wang,Kaixin Song
DOI: https://doi.org/10.3390/cryst13091296
IF: 2.7
2023-01-01
Crystals
Abstract:Mg2SiO4 and MgSiO3 ceramics with superior microwave dielectric properties are considered to be promising candidates for 5G applications. However, a slight deviation from the stoichiometric Mg/Si ratio will significantly influence their microwave dielectric properties, which will hinder their practical applications. In this work, the xMgO-SiO2 (x = 1~2) ceramics were synthesized by a solid-state reaction method. The influence of the Mg/Si ratio x on the crystalline phase, microstructure, and microwave dielectric properties was investigated through X-ray diffraction (XRD), a scanning electron microscope (SEM), and the resonant cavity method. The XRD patterns revealed the coexistence of Mg2SiO4 and MgSiO3 within the x range of 1~2, which was further demonstrated by the energy-dispersive X-ray spectra. The SEM images show a typical polycrystalline morphology of ceramics with an inhomogeneous grain size distribution. It is found that the microwave dielectric properties fluctuate at both sides of the x range while those remain relatively stable with minor changes at the intermediate components, indicating an obvious low composition dependence helpful for practical applications. Further, a demonstrator of a microstrip patch antenna for 5G applications using the 1.5MgO-SiO2 ceramic was designed and fabricated, and a return loss of −16.2 dB was demonstrated, which demonstrated the potential applications.