Effects of Electric Pulses on Annealing Hardening of Submicrometre Grained Copper

Wei Li,Yao Shen,Chi Xie
DOI: https://doi.org/10.1179/1743284715y.0000000011
IF: 1.8
2015-01-01
Materials Science and Technology
Abstract:Effects of electric pulses on the annealing hardening of submicrometre grained (0.1 μm < D < 1 μm) Cu processed by heavy cold rolling were investigated. Annealing induced hardening occurred after moderate annealing, which can be attributed to the dislocation source hardening rather than aging hardening, based on the fact that the ultrapure Cu showed higher hardening effect than commercial pure Cu. Electric pulses induced enhancement in the hardening effect for ultrapure Cu, but not for commercial pure Cu. The TEM investigations show that dislocation recovery was enhanced by electric pulses for ultrapure Cu, but not for commercial pure Cu due to the pinning effects of impurity, and negligible growth in both cases due to the short treatment time.
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