Combining X-ray Powder Diffraction and Electron Microscopy to Solve Complex Structures

Dan Xie,Ch. Baerlocher,Lynne B. McCusker

DOI: https://doi.org/10.1107/s0108767308093173

2008-01-01

Acta Crystallographica Section A Foundations of Crystallography

Abstract:Sessions 1to treat powder data is illustrated on a series of inorganic structures of variable complexity.

What problem does this paper attempt to address?

Combining Precession Electron Diffraction Data with X-ray Powder Diffraction Data to Facilitate Structure Solution

Dan Xie,Christian Baerlocher,Lynne B. McCusker

DOI: https://doi.org/10.1107/s0021889808034377

IF: 4.868

2008-01-01

Journal of Applied Crystallography

Abstract:Information derived from precession electron diffraction (PED) patterns can be used to advantage in combination with high-resolution X-ray powder diffraction data to solve crystal structures that resist solution from X-ray data alone. PED data have been exploited in two different ways for this purpose: (1) to identify weak reflections and (2) to estimate the phases of the reflections in the projection. The former is used to improve the partitioning of the reflection intensities within an overlap group and the latter to provide some starting phases for structure determination. The information was incorporated into a powder charge-flipping algorithm for structure solution. The approaches were first developed using data for the moderately complex zeolite ZSM-5, and then tested on TNU-9, one of the two most complex zeolites known. In both cases, including PED data from just a few projections facilitated structure solution significantly.
Structure Determination of Modulated Structures by Powder X-ray Diffraction and Electron Diffraction

Zhengyang Zhou,Lukas Palatinus,Junliang Sun

DOI: https://doi.org/10.1039/c6qi00219f

IF: 7.779

2016-01-01

Inorganic Chemistry Frontiers

Abstract:The combination of PXRD and ED is applied to determine modulated structures which resist solution by more conventional methods.
Solving Complex Structures by Combining Precession Electron Diffraction and X-ray Powder Diffraction Techniques

Dan Xie,Christian Baerlocher,Lynne B. McCusker

DOI: https://doi.org/10.1107/s0108767309097773

2009-01-01

Abstract:Page s 112 comparable to that that can be derived from an HRTEM image.These phases are then used in combination with the intensities extracted from the XPD data to initiate structure solution using the powder version of the charge-flipping algorithm [3] in the program Superflip [4].The approaches were first developed using data for the moderately complex zeolite ZSM-5, and then tested on TNU-9 [5], one of the two most complex zeolites known.In both cases, including PED data from just a few projections facilitated structure solution significantly.It should be noted that the methods are generally applicable (i.e.not zeolite specific), so it should be possible to apply them to any polycrystalline material.Furthermore, introducing information from PED data to the structure solution procedure is not restricted to charge flipping.It could also be used to advantage in other programs (e.g. in the form of better intensities in a directspace global optimization program or as starting phases for direct methods trials).Thus, the PED technique offers a relatively simple route to valuable information that can be used to complements that in a XPD pattern.
Towards scanning nanostructure X‐ray microscopy

Anton Kovyakh,Soham Banerjee,Chia-Hao Liu,Christopher J Wright,Yuguang C Li,Thomas E Mallouk,Robert Feidenhans'l,Simon J L Billinge,Christopher J. Wright,Yuguang C. Li,Thomas E. Mallouk,Simon J. L. Billinge

DOI: https://doi.org/10.1107/s1600576723005927

IF: 4.868

2023-07-30

Journal of Applied Crystallography

Abstract:A semi‐automated workflow is described for rapid‐scanning powder X‐ray diffraction and pair distribution function experiments. The software infrastructure saves metadata and raw and analyzed files into a collection stored on the local hard drive for easier reuse.This article demonstrates spatial mapping of the local and nanoscale structure of thin film objects using spatially resolved pair distribution function (PDF) analysis of synchrotron X‐ray diffraction data. This is exemplified in a lab‐on‐chip combinatorial array of sample spots containing catalytically interesting nanoparticles deposited from liquid precursors using an ink‐jet liquid‐handling system. A software implementation is presented of the whole protocol, including an approach for automated data acquisition and analysis using the atomic PDF method. The protocol software can handle semi‐automated data reduction, normalization and modeling, with user‐defined recipes generating a comprehensive collection of metadata and analysis results. By slicing the collection using included functions, it is possible to build images of different contrast features chosen by the user, giving insights into different aspects of the local structure.

chemistry, multidisciplinary,crystallography
On the Peak Shapes of X-Ray Micro Diffraction.

Hejing Wang,Jian Zhou

DOI: https://doi.org/10.1107/s0108767310093062

2010-01-01

Abstract:In this contribution, we will show examples of the strength of the combination of X-ray (micro-) diffraction, X-ray imaging and Computed Tomography (CT) results on solid objects.New developments -especially in detector technology -allow integration of these techniques on one laboratory X-ray diffraction system.By combining phase analysis with density and microstructure information a complete picture of the sample is obtained.Results can be correlated with macroscopic material properties.Examples from building materials, natural objects and pharmaceutical tablets are shown.
Electron Crystallography: Imaging and Single-Crystal Diffraction from Powders

Xiaodong Zou,Sven Hovmöller

DOI: https://doi.org/10.1107/s0108767307060084

2007-01-01

Abstract:The study of crystals at atomic level by electrons – electron crystallography – is an important complement to X-ray crystallography. There are two main advantages of structure determinations by electron crystallography compared to X-ray diffraction: (i) crystals millions of times smaller than those needed for X-ray diffraction can be studied and (ii) the phases of the crystallographic structure factors, which are lost in X-ray diffraction, are present in transmission-electron-microscopy (TEM) images. In this paper, some recent developments of electron crystallography and its applications, mainly on inorganic crystals, are shown. Crystal structures can be solved to atomic resolution in two dimensions as well as in three dimensions from both TEM images and electron diffraction. Different techniques developed for electron crystallography, including three-dimensional reconstruction, the electron precession technique and ultrafast electron crystallography, are reviewed. Examples of electron-crystallography applications are given. There is in principle no limitation to the complexity of the structures that can be solved by electron crystallography.
Application of X-ray Diffraction and Electron Crystallography for Solving Complex Structure Problems

Jian Li,Junliang Sun

DOI: https://doi.org/10.1021/acs.accounts.7b00366

IF: 24.466

2017-01-01

Accounts of Chemical Research

Abstract:ConspectusAll crystalline materials in nature, whether inorganic, organic, or biological, macroscopic or microscopic, have their own chemical and physical properties, which strongly depend on their atomic structures. Therefore, structure determination is extremely important in chemistry, physics, materials science, etc. In the past centuries, many techniques have been developed for structure determination. The most widely used one is X-ray crystallography (single-crystal X-ray diffraction (SCXRD) and powder X-ray diffraction (PXRD)), and it remains the most important technique for structure determination of crystalline materials. Although SCXRD and PXRD are successful in many cases, a number of reasons limit their applications, such as SCXRD for nanosized crystals, intergrowth, and defects and PXRD for complex structures, multiphasic samples, impurities, peak overlaps, etc. Another most valuable technique for structure determination is electron crystallography (EC). With the electron as a probe, EC alone ...
High-Resolution Scanning X-ray Diffraction Microscopy

Pierre Thibault,Martin Dierolf,Andreas Menzel,Oliver Bunk,Christian David,Franz Pfeiffer

DOI: https://doi.org/10.1126/science.1158573

IF: 56.9

2008-07-18

Science

Abstract:Coherent diffractive imaging (CDI) and scanning transmission x-ray microscopy (STXM) are two popular microscopy techniques that have evolved quite independently. CDI promises to reach resolutions below 10 nanometers, but the reconstruction procedures put stringent requirements on data quality and sample preparation. In contrast, STXM features straightforward data analysis, but its resolution is limited by the spot size on the specimen. We demonstrate a ptychographic imaging method that bridges the gap between CDI and STXM by measuring complete diffraction patterns at each point of a STXM scan. The high penetration power of x-rays in combination with the high spatial resolution will allow investigation of a wide range of complex mesoscopic life and material science specimens, such as embedded semiconductor devices or cellular networks.

multidisciplinary sciences
Structure Determination of Submicron-Sized Porous Materials by EM and XRD

J. Sun

DOI: https://doi.org/10.1107/s205327331409069x

2014-01-01

Abstract:Structure determination of submicron-sized porous materials is always a great challenge for widening their industrial application. There are a few reasons for this challenge, such as 1) their big unit cell dimensions cause serious peak overlapping in powder X-ray diffraction (PXRD); 2) typical disordered guest molecules in the big portion of pores lower the resolution; 3) their relatively low stability prevents an easy application of high resolution transmission electron microscope image (HRTEM) and STEM techniques. PXRD and electron diffraction (ED) techniques are complimentary for the structure determination of such materials. The PXRD technique gives very accurate intensities and the major difficulty for the structure determination from PXRD is the peak overlapping while there is almost no peak overlapping in ED since the single-crystal-like ED patterns can be obtained from nano-sized crystals. For the ED techniques, the intensities suffer severely from dynamical effects which make it less reliable for the structure determination in many cases. The combination of them can overcome both shortcomings and solve most difficulties in the structure determination of submicron-sized porous materials. Here we will use a few examples to demonstrate how this combination facilitates the structure determination, such as ITQ-37, PKU-16, PKU-3, ITQ51.
Solving Three-Dimensional Structures of Nano- and Intergrown Porous Silicates by Combining Electron Crystallography and Powder X-ray Diffraction

Xiaodong Zou,Tom Willhammar,Wei Wan,Junliang Sunand Peter Oleynikov

DOI: https://doi.org/10.1107/s0108767312097991

2012-01-01

Abstract:Electron crystallography has two main advantages in structure solution compared to X-ray diffraction: 1) crystals millions times smaller than what is needed for X-ray diffraction can be studied and 2) the crystallographic structure factor phases are present in high resolution transmission electron microscopy (HRTEM) images [1].In order to make electron crystallography more feasible for non-TEM experts, we have developed two methods; 1)rotation electron diffraction (RED) [2] for collectingcomplete 3D electron diffraction data that transforms a TEM into a single nano-crystal diffractometer and 2)structure projection reconstruction [3] that determines the defocus values from a through-focus series of HRTEM images.Each image in the series is corrected for the effects of contrast transfer function and then combined into a structure projection image.The method works for both crystalline and non-crystalline objects.Here we show how these two methods are used to solve the structures of complex intergrown zeolites ITQ-39 [4].The structure was confirmed by simulations of powder X-ray diffraction from the disordered model.The methods are general and can be applied to any crystalline materials, where the crystals are too small or the structures too complicated to be solved by X-ray powder diffraction alone, especially for those crystals containing defects.
Electron Microscopy and Diffraction of Crystalline Dendrimers and Macrocycles

CJ BUCHKO,PM WILSON,Z XU,J ZHANG,JS MOORE,DC MARTIN

DOI: https://doi.org/10.1016/0032-3861(95)90927-t

IF: 4.6

1995-01-01

Polymer

Abstract:The precisely defined geometry of phenylacetylene dendrimers and macrocycles makes it possible to investigate systematic variations in chemical architecture on the nature of microstructural organization. Here we report on transmission electron microscopy, selected-area electron diffraction and high-resolution electron microscopy studies of crystalline phases of these synthetic materials. Since the molecules are sensitive to electron beam damage, low-dose techniques were used to capture images and diffraction patterns dynamically. The data show increased crystal misorientation with increasing side-group length and molecular complexity. As the size increases, the number of conformations available to the molecule also increases, making it difficult to pack the molecules with fewer defects.
Structure Determination of IM-5 by Electron Microscopy Alone

Junliang Sun,Zhanbing He,Sven Hovmoller,Xiaodong Zou,Fabian Gramm,Christian Baerlocher,Lynne B. McCusker

DOI: https://doi.org/10.1107/s0108767309095300

2009-01-01

Acta Crystallographica Section A Foundations of Crystallography

Abstract:Possible methods for collecting complete 3D electron diffraction data from crystals much smaller than 1μm 3 are described.Data can be collected on a CCD camera and automatically extracted by computer.The critical question of data quality is addressed -can electron diffraction data compete with X-ray diffraction data in terms of resolution, completeness and quality of intensities?
Using Phases Retrieved from Two-Dimensional Projections to Facilitate Structure Solution from X-Ray Powder Diffraction Data

Dan Xie,Christian Baerlocher,Lynne B. McCusker

DOI: https://doi.org/10.1107/s0021889811030214

IF: 4.868

2011-01-01

Journal of Applied Crystallography

Abstract:A single-crystal charge-flipping algorithm has been applied to two-dimensional projections derived from X-ray powder diffraction data to retrieve structure-factor phases. These phases proved to be as reliable as those obtained from high-resolution transmission electron microscopy (HRTEM) images or from precession electron diffraction data. In particular, the stronger reflections tend to be correctly phased. The two-dimensional electron-density 'images' obtained in this way show the same features as the corresponding HRTEM images, but with higher resolution. Application of the powder charge-flipping algorithm to the full three-dimensional powder diffraction data in conjunction with phases derived from several such (arbitrarily selected) projections was found to have a significant and beneficial effect on the structure solution. The approach was first developed using data collected on the complex zeolite TNU-9, and was then tested further using data for IM-5 and SSZ-74, two similarly complex zeolites. All three of these structures were originally solved by combining X-ray powder diffraction and electron microscopy data, because X-ray diffraction data alone were not sufficient. In all three cases, the phase information derived from two-dimensional subsets of the X-ray powder diffraction data resulted in a significant improvement in the electron-density maps generated by the powder charge-flipping algorithm. The inclusion of this phase information allowed all three structures to be determined from the X-ray data alone. This two-dimensional X-ray powder diffraction approach appears to offer a remarkably simple and powerful method for solving the structures of complex polycrystalline materials.
Structure Determination of Nanocrystals

Junliang Sun

DOI: https://doi.org/10.1107/s0108767321093582

2021-01-01

Abstract:Structure determination of nano-size crystals is always a challenging problem.For quite lots of materials, it is very difficult to synthesize large/good enough crystals for single crystal X-ray diffraction studies.Powder X-ray diffraction (PXRD) is the major method for their atomic structure determination, PXRD is a quite mature technique and lots of powder structures were solved.However, for complicated structures with huge unit cell dimensions or those with crystal sizes smaller than 100nm, it is quite often to have severe peak overlapping problems, which makes it extremely difficult to solve the structure from PXRD alone.Electrons which interact with matter much stronger than X-ray can produce single-crystal-like diffraction from nano-crystalline materials, which makes it possible to collect single-crystal-like diffraction data.The 3D electron diffraction technique can be used for collecting 3D electron diffraction data.Compared with traditional electron diffraction methods, this technique gives lower dynamical effects and much higher data completeness.Using the intensities abstracted from the data, complicated structures can be directly solved using the similar methods as single-crystal X-ray diffraction.Combining it with other techniques, such as PXRD or even SXRD, more complicated structures can be solved.
Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope

T.P. McAuliffe,A. Foden,C. Bilsland,D. Daskalaki-Mountanou,D. Dye,T.B. Britton

DOI: https://doi.org/10.1016/j.ultramic.2020.112944

2020-01-14

Abstract:The routine and unique determination of minor phases in microstructures is critical to materials science. In metallurgy alone, applications include alloy and process development and the understanding of degradation in service. We develop a correlative method, exploring superalloy microstructures which are examined in the scanning electron microscope (SEM) using simultaneous energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD). This is performed at an appropriate length scale for characterisation of carbide phases' shape, size, location, and distribution. EDS and EBSD data are generated using two different physical processes, but each provide a signature of the material interacting with the incoming electron beam. Recent advances in post-processing, driven by "big data" approaches, include use of principal component analysis (PCA). Components are subsequently characterised to assign labels to a mapped region. To provide physically meaningful signals, the principal components may be rotated to control the distribution of variance. In this work, we develop this method further through a weighted PCA approach. We use the EDS and EBSD signals concurrently, thereby labelling each region using both EDS (chemistry) and EBSD (crystal structure) information. This provides a new method of amplifying signal-to-noise for very small phases in mapped regions, especially where the EDS or EBSD signal is not unique enough alone for classification.

Materials Science
Serial Chemical Crystallography for Autonomous Quantitative Phase Analysis in an Electron Microscope

Taimin Yang,David Waterman,Zheting Chu,James Beilsten-Edmands,Zhehao Huang,Xiaodong Zou

DOI: https://doi.org/10.21203/rs.3.rs-5300199/v1

2024-01-01

Abstract:Recent advancements in robotics and artificial intelligence have accelerated the development of autonomous workflows for material discovery. Powder X-ray diffraction (PXRD) remains the primary method for characterizing crystal structures in these workflows. However, its limitations become apparent when peak overlapping becomes severe. To address this, we present serial electron diffraction with tilt (t-SerialED), a method for fast autonomous phase and structural analysis of beam-sensitive, nano-sized polycrystalline materials. t-SerialED incorporates 3D reciprocal space information into SerialED, ensuring reliable quantitative phase analysis for complex mixtures that are difficult to analyze by traditional techniques. Conducted in a standard electron microscope without specialized hardware, t-SerialED enables high-throughput analysis of beam-sensitive, multi-phase mixtures across a wide range of materials, from nanoporous frameworks to pharmaceutical compounds. By resolving key challenges in serial crystallography such as indexing and preferred orientation, this method enables precise structure determination, including the visualization of disordered guest molecules and non-covalent interactions like hydrogen bonding network and proton charge transfer. t-SerialED expands the capabilities of serial chemical crystallography and it can become a complementary method to traditional crystallography methods, offering a robust solution for routine quantitative phase analysis and structure determination.
Crystal Structures from Powder Diffraction: Principles, Difficulties and Progress

Radovan Černý

DOI: https://doi.org/10.3390/cryst7050142

IF: 2.7

2017-05-16

Crystals

Abstract:The structure solution from powder diffraction has undergone an intense evolution during the last 20 years, but is far from being routine. Current challenges of powder crystallography include ab initio crystal structure determination on real samples of new materials with specific microstructures, characterization of intermediate reaction products from in situ, in operando studies and novel phases from in situ studies of phase diagrams. The intense evolution of electron diffraction in recent years, providing an experimental (precession) and theoretical (still under intense development) solution to strong dynamic scattering of electrons, smears the traditional frontier between poly- and single-crystal diffraction. Novel techniques like serial snapshot X-ray crystallography point in the same direction. Finally, for the computational chemistry, theoreticians hand-in-hand with crystallographers develop tools where the theory meets experiment for crystal structure refinement, which becomes an unavoidable step in the validation of crystal structures obtained from powder diffraction.

materials science, multidisciplinary,crystallography
Time-Resolved X-Ray Scattering of an Electronically Excited State in Metal Complexes in Solution

Martin M. Nielsen,Morten Christensen,Kristoffer Haldrup,Niels Harrit,Robert Feidenhans'l,Qingyu Kong,Marco Cammarata,Lo Russo Manuela,Michael Wulff

DOI: https://doi.org/10.1107/s0108767308095494

2008-01-01

Abstract:In 1999, researchers extended X-ray crystallography to allow the imaging of non-crystalline specimens by measuring the X-ray diffraction pattern of a non-crystalline specimen and then directly phasing it using the oversampling method with an iterative algorithm.The new imaging modality, called coherent diffraction microscopy or lensless imaging, has since evolved moving in three important directions.The first is the three-dimensional (3D) structural determination of non-crystalline materials.The second is towards the 3D imaging of whole cells at a resolution of 10 nm or better.The third is the potential of imaging single large protein complexes using extremely intense and ultrashort X-ray pulses.In this talk, we will review the principle of coherent diffraction microscopy, and present some applications of the imaging modality to nanoscience and biology by using synchrotron radiation, high harmonic generation and soft X-ray laser sources.Finally, we will discuss the future opportunity with X-ray free electron lasers.
Circumventing a challenging aspect of crystal structure determination from powder diffraction data

Kenneth D. M. Harris

DOI: https://doi.org/10.1107/S2052520622003717

2022-04-06

Abstract:Schmidt and co-workers [Acta Cryst. (2022), B78, 195–213], report a strategy for structure determination from powder XRD data in which unit-cell determination and structure solution are combined within a single process, rather than handling them as sequential stages on the structure determination pathway. This strategy offers the prospect to achieve successful structure determination in cases for which conventional approaches for indexing powder XRD data prove to be challenging.
X-Ray Powder Diffraction from Sub-Micron Crystals of Photosystem-1 Membrane Protein

D. A. Shapiro,D. DePonte,R. B. Doak,P. Fromme,G. Hembree,M. Hunter,S. Marchesini,K. Schmidt,D. Starodub,U. Weierstall,H. Chapman,J. Spence,D.A. Shapiro,R.B. Doak

DOI: https://doi.org/10.48550/arXiv.0803.4027

2008-03-27

Biological Physics

Abstract:We demonstrate that powder diffraction data can be collected from sub-micron crystals of a mbrane protein with nearly two orders of magnitude more atoms than the molecules commonly used for powder diffraction. The crystals of photosystem-1 protein were size-selected using a 500 nm pore- size filter and delivered to a soft x-ray beam with a photon energy of 1.5 keV using a dynamically focused micro-jet developed for the serial crystallography experiment at beamline 9.0.1. The 10-micron jet places many such randomly oriented crystals in the x-ray beam simultaneously resulting in a powder diffraction pattern which extends to 28 angstrom resolution with just 200 seconds of x-ray exposure. The use of the jet for particle delivery allows for a thin sample, appropriate for the soft x-rays used, and continuously refreshes the crystals so that radiation damage is not possible. The small size of the crystals requires the use of lower energy photons for increased scattering strength and increased spacing between powder rings. The powder patterns obtained in this way, from abundant nano-crystals, could be used to provide low resolution molecular envelopes if phased using techniques such as compressive sensing which do not require atomic resolution data. The results also serve to test our aerojet injector system, with future application to femtosecond diffraction in Free Electron X-ray Laser schemes, and for Serial Crystallography using a single-file beam of aligned hydrated molecules.

Combining X-ray Powder Diffraction and Electron Microscopy to Solve Complex Structures

Combining Precession Electron Diffraction Data with X-ray Powder Diffraction Data to Facilitate Structure Solution

Structure Determination of Modulated Structures by Powder X-ray Diffraction and Electron Diffraction

Solving Complex Structures by Combining Precession Electron Diffraction and X-ray Powder Diffraction Techniques

Towards scanning nanostructure X‐ray microscopy

On the Peak Shapes of X-Ray Micro Diffraction.

Electron Crystallography: Imaging and Single-Crystal Diffraction from Powders

Application of X-ray Diffraction and Electron Crystallography for Solving Complex Structure Problems

High-Resolution Scanning X-ray Diffraction Microscopy

Structure Determination of Submicron-Sized Porous Materials by EM and XRD

Solving Three-Dimensional Structures of Nano- and Intergrown Porous Silicates by Combining Electron Crystallography and Powder X-ray Diffraction

Electron Microscopy and Diffraction of Crystalline Dendrimers and Macrocycles

Structure Determination of IM-5 by Electron Microscopy Alone

Using Phases Retrieved from Two-Dimensional Projections to Facilitate Structure Solution from X-Ray Powder Diffraction Data

Structure Determination of Nanocrystals

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope

Serial Chemical Crystallography for Autonomous Quantitative Phase Analysis in an Electron Microscope

Crystal Structures from Powder Diffraction: Principles, Difficulties and Progress

Time-Resolved X-Ray Scattering of an Electronically Excited State in Metal Complexes in Solution

Circumventing a challenging aspect of crystal structure determination from powder diffraction data

X-Ray Powder Diffraction from Sub-Micron Crystals of Photosystem-1 Membrane Protein