Ultrafast Imaging and the Phase Problem for Inelastic X‐Ray Scattering

Peter Abbamonte,Gerard C. L. Wong,David G. Cahill,J. Reed,Robert H. Coridan,Nathan W. Schmidt,Ghee Hwee Lai,Young Il Joe,D. Casa
DOI: https://doi.org/10.1002/adma.200904098
IF: 29.4
2010-01-01
Advanced Materials
Abstract:A new method for imaging ultrafast dynamics in condensed matter using inelastic X‐ray scattering (IXS) is described. Using the concepts of causality and irreversibility a general solution to the inverse scattering problem (or “phase problem”) for IXS is illustrated, which enables direct imaging of dynamics of the electron density with resolutions of ∼1 attosecond (10 −18 s) in time and <1 Å in space. This method is not just Fourier transformation of the IXS data, but a means to impose causality on the data and reconstruct the charge propagator. The method can also be applied to inelastic electron or neutron scattering. A general outline of phenomena that can and cannot be studied with this technique and an outlook for the future is provided.
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