Supplementary Material: on Nonparametric Statistical Process Control of Univariate Processes

Peihua Qiu,Zhonghua Li

2011-01-01

Technometrics

Abstract:This article considers statistical process control (SPC) of univariate processes when the parametric form of the process distribution is unavailable.

What problem does this paper attempt to address?

On nonparametric statistical process control of univariate processes

Peihua Qiu.,Zhonghua Li

DOI: https://doi.org/10.1198/TECH.2011.10005

2012-01-01

Technometrics

Abstract:This article considers statistical process control (SPC) of univariate processes when the parametric form of the process distribution is unavailable. Most existing SPC procedures are based on the assumption that a parametric form (e.g., normal) of the process distribution can be specified beforehand. In the literature, it has been demonstrated that their performance is unreliable in cases when the prespecified process distribution is invalid. To overcome this limitation, some nonparametric (or distribution-free) SPC charts have been proposed, most of which are based on the ordering information of the observed data. This article tries to make two contributions to the nonparametric SPC literature. First, we propose an alternative framework for constructing nonparametric control charts, by first categorizing observed data and then applying categorical data analysis methods to SPC. Under this framework, some new nonparametric control charts are proposed. Second, we compare our proposed control charts with several representative existing control charts in various cases. Some empirical guidelines are provided for users to choose a proper nonparametric control chart for a specific application. This article has supplementary materials online.
Some perspectives on nonparametric statistical process control

Peihua Qiu

DOI: https://doi.org/10.1080/00224065.2018.1404315

IF: 2.182

2018-01-02

Journal of Quality Technology

Abstract:Statistical process control (SPC) charts play a central role in quality control and management. Many conventional SPC charts are designed under the assumption that the related process distribution is normal. In practice, the normality assumption is often invalid. In such cases, some articles show that certain conventional SPC charts are robust and can still be used as long as their parameters are properly chosen. Some other articles argue that results from such conventional SPC charts would not be reliable and that nonparametric SPC charts should be considered instead. In recent years, many nonparametric SPC charts have been proposed. Most of them are based on the ranking information in process observations collected at different time points. Some of them are based on data categorization and categorical data analysis. In this article, we give some perspectives on issues related to the robustness of conventional SPC charts and to the strengths and limitations of various nonparametric SPC charts.

engineering, industrial,operations research & management science,statistics & probability
Distribution-free monitoring of univariate processes

Peihua Qiu.,Zhonghua Li

DOI: https://doi.org/10.1016/j.spl.2011.07.004

IF: 0.718

2011-01-01

Statistics & Probability Letters

Abstract:We consider statistical process control (SPC) of univariate processes when observed data are not normally distributed. Most existing SPC procedures are based on the normality assumption. In the literature, it has been demonstrated that their performance is unreliable in cases when they are used for monitoring non-normal processes. To overcome this limitation, we propose two SPC control charts for applications when the process data are not normal, and compare them with the traditional CUSUM chart and two recent distribution-free control charts. Some empirical guidelines are provided for practitioners to choose a proper control chart for a specific application with non-normal data.
Statistical Process Control Using A Dynamic Sampling Scheme

Zhonghua Li,Peihua Qiu

DOI: https://doi.org/10.1080/00401706.2013.844731

2014-01-01

Technometrics

Abstract:This article considers statistical process control (SPC) of univariate processes, and tries to make two contributions to the univariate SPC problem. First, we propose a continuously variable sampling scheme, based on a quantitative measure of the likelihood of a process distributional shift at each observation time point, provided by the p-value of the conventional cumulative sum (CUSUM) charting statistic. For convenience of the design and implementation, the variable sampling scheme is described by a parametric function in the flexible Box–Cox transformation family. Second, the resulting CUSUM chart using the variable sampling scheme is combined with an adaptive estimation procedure for determining its reference value, to effectively protect against a range of unknown shifts. Numerical studies show that it performs well in various cases. A real data example from a chemical process illustrates the application and implementation of our proposed method. This article has supplementary materials online.
Motivation for Multivariate Statistical Process Control

Uwe Krüger,Lei Xie

DOI: https://doi.org/10.1002/9780470517253.ch1

2012-01-01

Abstract:This chapter contains sections titled: Summary of statistical process control Why multivariate statistical process control Tutorial session
Performance Monitoring of Chemical Process Based on Multivariable Statistical Technology

Li Xiong,Jun Liang,Jixin Qian

DOI: https://doi.org/10.1109/wcica.2006.1714133

2006-01-01

Abstract:Principal component analysis (PCA) can be effectively used to eliminate system noise and correlation between process variables but to reserve enough original data information. Based on principal component model, performance monitoring and analysis was carried out on control system with multivariate statistical index, such as Q residuals, Hotelling T2 and principal scores. This method with multivariable statistical technologies gives explicit knowledge about control system: whether the system is in-control or out-control, how disturbance and system variables influence the performance and how the control strategy work. Control system then could be evaluated with these knowledges. Application to two typical chemical processes shows the example of the method practical function
Statistical Monitoring of Complex Multivariate Processes : with Applications in Industrial Process Control

U. Kruger,Lei Xie

DOI: https://doi.org/10.1002/9780470517253

2012-01-01

Abstract:The development and application of multivariate statistical techniques in process monitoring has gained substantial interest over the past two decades in academia and industry alike. Initially developed for monitoring and fault diagnosis in complex systems, such techniques have been refined and applied in various engineering areas, for example mechanical and manufacturing, chemical, electrical and electronic, and power engineering. The recipe for the tremendous interest in multivariate statistical techniques lies in its simplicity and adaptability for developing monitoring applications. In contrast, competitive model, signal or knowledge based techniques showed their potential only whenever cost-benefit economics have justified the required effort in developing applications.
SVM-based Multivariate Statistical Process Control Method and Its Application

LIU Yu-ming,LIANG Jun,MAO Yong,CHEN Guo-jin,QIAN Ji-xin

DOI: https://doi.org/10.3785/j.issn.1008-973x.2006.10.013

2006-01-01

Abstract:In multivariate statistical process control(MSPC),fault detection,fault identification and fault isolation are challenging problems.An integrated novel MSPC method was proposed by combining multivariate feature extraction with three SVM-based methods commonly used in one-class classifier design,key feature selection and multi-class classifier design,respectively.In this method it was able to calculate control limits of multiple statistics for fault detection simultaneously without conventional theoretical distribution assumptions,and to determine the key variables for fault identification based on both their magnitude changes and their contributions to fault classification in residual space which improves the identification accuracy,and fault isolation was implemented by taking advantage of the wellknown properties of SVM-based multi-class classifier which avoids introducing specific discriminant criteria.Using principal component analysis(PCA) as feature extraction method,the SVM-based MSPC method was demonstrated by application to a benchmark simulator Tennessee Eastman process.The results showed the advantages.
Process monitoring and fault detection based on multivariate statistical projection analysis

Guo-jin Chen,Jun Liang,Ji-xin Qian

DOI: https://doi.org/10.1109/ICSMC.2004.1400742

2004-01-01

Abstract:Multivariate statistical process control (MSPC) has been applied to performance monitoring for chemical process. However, conventional methods of MSPC are based on the premise that the extracted latent variables must be subjected to normal distribution, which often can't be satisfied. In this paper, a new method based on independent component analysis (ICA) and principal component analysis (PCA) is presented for process performance monitoring, in which a two-step procedure is employed. At first step, process operating information with non-normal distribution is extracted by means of ICA, and the density function of this part of information is estimated by means of parzen density estimator for calculating the confidence limits. At the second step, the information with normal distribution is extracted from the underlying residual data sets by PCA, and the confidence limits are determined on Q and hotelling T2 statistics. With the primary advantage of which no assumption of normal distribution on process data sets is needed, the proposed method is applied to a double-effect evaporator, and the simulation results verify it effective.
Multivariate Statistical Process Monitoring and Control: Recent Developments and Applications to Chemical Industry

Jun Liang

2003-01-01

Abstract:Multivariate statistical process monitoring and control (MSPMC) methods for chemical process monitoring with statistical projection techniques such as principal component analysis (PCA) and partial least squares (PLS) are surveyed in this paper. The four-step procedure of performing MSPMC for chemical process, modeling of processes, detecting abnormal events or faults, identifying the variable(s) responsible for the faults and diagnosing the source cause for the abnormal behavior, is analyzed. Several main research directions of MSPMC reported in the literature are discussed, such as multi-way principal component analysis (MPCA) for batch process, statistical monitoring and control for nonlinear process, dynamic PCA and dynamic PLS, and on-line quality control by inferential models. Industrial applications of MSPMC to several typical chemical processes, such as chemical reactor, distillation column, polymerization process, petroleum refinery units, are summarized. Finally, some concluding remarks and future considerations are made.
Investigation of Dynamic Multivariate Chemical Process Monitoring

Xie Lei,Zhang Jianming,Wang Shuqing

DOI: https://doi.org/10.1016/s1004-9541(06)60116-x

2006-01-01

Abstract:Chemical process variables are always driven by random noise and disturbances. The closed-loop control yields process measurements that are auto and cross correlated. The influence of auto and cross correlations on statistical process control (SPC) is investigated in detail by Monte Carlo experiments. It is revealed that in the sense of average performance, the false alarms rates (FAR) of principal component analysis (PCA), dynamic PCA are not affected by the time-series structures of process variables. Nevertheless, non-independent identical distribution will cause the actual FAR to deviate from its theoretic value apparently and result in unexpected consecutive false alarms for normal operating process. Dynamic PCA and ARMA-PCA are demonstrated to be inefficient to remove the influences of auto and cross correlations. Subspace identification-based PCA (SI-PCA) is proposed to improve the monitoring of dynamic processes. Through state space modeling, SI-PCA can remove the auto and cross correlations efficiently and avoid consecutive false alarms. Synthetic Monte Carlo experiments and the application in Tennessee Eastman challenge process illustrate the advantages of the proposed approach.
Control chart for monitoring multivariate COM-Poisson attributes

Aamir Saghir,Zhengyan Lin

DOI: https://doi.org/10.1080/02664763.2013.838666

IF: 1.416

2014-01-01

Journal of Applied Statistics

Abstract:Statistical process control of multi-attribute count data has received much attention with modern data-acquisition equipment and online computers. The multivariate Poisson distribution is often used to monitor multivariate attributes count data. However, little work has been done so far on under- or over-dispersed multivariate count data, which is common in many industrial processes, with positive or negative correlation. In this study, a Shewhart-type multivariate control chart is constructed to monitor such kind of data, namely the multivariate COM-Poisson (MCP) chart, based on the MCP distribution. The performance of the MCP chart is evaluated by the average run length in simulation. The proposed chart generalizes some existing multivariate attribute charts as its special cases. A real-life bivariate process and a simulated trivariate Poisson process are used to illustrate the application of the MCP chart.
Fault Detection and Isolation of Non-Gaussian and Nonlinear Processes Based on Statistics Pattern Analysis and the K-Nearest Neighbor Method

Zhe Zhou,Jian Wang,Chunjie Yang,Chenglin Wen,Zuxin Li

DOI: https://doi.org/10.1021/acsomega.2c01279

IF: 4.1

2022-01-01

ACS Omega

Abstract:Only low-order information of process data (i.e., mean, variance, and covariance) was considered in the principal component analysis (PCA)-based process monitoring method. Consequently, it cannot deal with continuous processes with strong dynamics, nonlinearity, and non-Gaussianity. To this aim, the statistics pattern analysis (SPA)-based process monitoring method achieves better monitoring results by extracting higher-order statistics (HOS) of the process variables. However, the extracted statistics do not strictly follow a Gaussian distribution, making the estimated control limits in Hotelling-T 2 and squared prediction error (SPE) charts inaccurate, resulting in unsatisfactory monitoring performance. In order to solve this problem, this paper presents a novel process monitoring method using SPA and the k-nearest neighbor algorithm. In the proposed method, first, the statistics of process variables are calculated through SPA. Then, the k-nearest neighbor (kNN) method is used to monitor the extracted statistics. The kNN method only uses the paired distance of samples to perform fault detection. It has no strict requirements for data distribution. Hence, the proposed method can overcome the problems caused by the non-Gaussianity and nonlinearity of statistics. In addition, the potential of the proposed method in early fault detection or safety alarm and fault isolation is explored. The proposed method can isolate which variable or its statistic is faulty. Finally, the numerical examples and Tennessee Eastman benchmark process illustrate the effectiveness of the proposed method.
An Approach to Statistical Process Control that is New, Nonparametric, Simple, and Powerful

W. J. Conover,Victor G. Tercero,Alvaro E. Cordero-Franco

DOI: https://doi.org/10.48550/arXiv.1901.04443

2019-01-15

Abstract:To maintain the desired quality of a product or service it is necessary to monitor the process that results in the product or service. This monitoring method is called Statistical Process Management, or Statistical Process Control. It is in widespread usage in industry. Extensive statistical methodology has been developed to make it possible to detect when a process goes out of control while allowing for natural variability that occurs when the process is in control. This paper introduces nonparametric methods for monitoring data, whether it is univariate or multivariate, and whether the interest is in detecting a change of location or scale or both. These methods, based on sequential normal scores, are much simpler than the most popular nonparametric methods currently in use and have good power for detecting out of control observations. Sixteen new statistical tests are introduced for the first time in this paper, with 17 examples, 33 tables, and 48 figures to complete the instructions for their application.

Methodology
A Distribution-Free Method for Process Monitoring

Zhiqiang Ge,Zhihuan Song

DOI: https://doi.org/10.1016/j.eswa.2011.02.048

IF: 8.5

2011-01-01

Expert Systems with Applications

Abstract:Traditional multivariate statistical process control methods such as principal component analysis are limited to Gaussian process data when they used for process monitoring. However, the deficiency is not due to the method itself, but lies in the monitoring statistic construction and its confidence limit determination. This paper proposed a distribution-free method, which employs the one-class SVM to construct new monitoring statistics. Thus two new statistics are developed separately in two subspaces of the PCA model: the principal component subspace and the residual subspace. When some fault has been detected, a novel fault reconstruction scheme is proposed. For fault identification, two new identification indices are constructed. The performance of the proposed method in fault detection, reconstruction and identification is evaluated through a case study of the Tennessee Eastman (TE) benchmark process.
Statistical Process Control of Over-Dispersed Multivariate Count Data

Yan-ting Li,Li-feng Xi

DOI: https://doi.org/10.1109/icieem.2010.5646482

2010-01-01

Abstract:Statistical process control of multi-attribute data has received much attention. However, little work has been done on over-dispersed multivariate count data with either positive or negative correlations. In this article, we focus on designing a new control scheme for such kind of data. The new method models the data with the Poisson Log-normal distribution and monitors the process with Hotelling T 2 control chart. The parameter estimation is achieved via Quasi-Newton algorithm. The limitation of some existing multi-attribute control charts in presence of over-dispersion is also shown. Furthermore, the performance of the new control chart is evaluated by Monte Carlo simulation.
SPC Monitoring of MMSE- and Pi-Controlled Processes

Wei Jiang,Kwok-Leung Tsui

DOI: https://doi.org/10.1080/00224065.2002.11980171

IF: 2.182

2002-10-01

Journal of Quality Technology

Abstract:To reduce variation in manufacturing processes, traditional statistical process control (SPC) techniques can be applied to monitor automatic process control (APC) controlled processes for detecting assignable cause process variation. In this paper we compare the monitoring of process output and the monitoring of the control action of Minimum-Mean-Squared-Error- and Proportional-Integral-Controlled processes. We show that the robustness property of the PI controller makes it difficult to detect unanticipated mean shifts when the process output is being monitored. We illustrate how the signal-to-noise ratios developed in Jiang, Tsui, and Woodall (2000) can be used to predict the SPC chart performance and help select the appropriate chart for monitoring.

engineering, industrial,operations research & management science,statistics & probability
A Multivariate Sign Chart for Monitoring Process Shape Parameters

Zhonghua Li,Changliang Zou,Zhaojun Wang,Longcheen Huwang

DOI: https://doi.org/10.1080/00224065.2013.11917923

IF: 2.182

2013-01-01

Journal of Quality Technology

Abstract:This paper develops a new multivariate nonparametric statistical process control (SPC) control chart for monitoring shape parameters, which is based on integrating a powerful multivariate spatial-sign test and exponentially weighted moving average (EWMA) control scheme to on-line sequential monitoring. It has a strictly distribution-free property over a broad class of population models, which implies the in-control run-length distribution can attain or is always very close to the nominal one when using the same control limit designed for the multivariate normal distribution. This proposed control chart possesses some other positive features: its computation speed is fast with a similar computation effort to the parametric multivariate EWMA (MEWMA) counterpart; it is easy to implement because only the multivariate median and the associated transformation matrix need to be estimated from the historical data before monitoring; it is efficient in detecting small or moderate shifts, when the process distribution is heavy tailed or skewed; it is also able to handle the case when the sample size is one and is effective in downward shifts. Simulation comparisons and a real-data example from a white-wine production process show that it performs quite well in applications.
Semiconductor Manufacturing Process Monitoring Based on Adaptive Substatistical PCA

Zhiqiang Ge,Zhihuan Song

DOI: https://doi.org/10.1109/tsm.2009.2039188

IF: 2.7

2010-01-01

IEEE Transactions on Semiconductor Manufacturing

Abstract:Increasing yield and improving product quality are two important issues in the area of semiconductor manufacturing. The purpose of multivariate statistical process control is to improve process operations by quickly detecting process abnormalities and diagnosing the sources of the detected process abnormalities. The statistical-based multiway principal component analysis (PCA) method has drawn increasing interest in semiconductor manufacturing process monitoring. However, there are several drawbacks of this method, including future value estimation, limited number of batches, and non-Gaussian behavior of the process data. This paper proposes a new adaptive substatistical PCA-based method that can avoid future value estimation. By employing support vector data description, a new monitoring statistic is developed that has no Gaussian limitation of the process data. In addition, correlations among the new method, multimodel, and multiway PCA are detailed. Capabilities of the proposed method are demonstrated by an industrial example.
Statistical Process Control for Multistage Manufacturing and Service Operations: A Review

Fugee Tsung,Yanting Li,Ming Jin

DOI: https://doi.org/10.1109/soli.2006.329084

2006-01-01

Abstract:Manufacturing and service processes today usually involve several process stages and operations. With an emphasis on achieving satisfactory product and service quality, using statistical methods for multistage process surveillance and fault diagnosis has become a necessity. Statistical process control methods have been widely recognized as effective approaches for process monitoring and diagnosis. However, most conventional SPC methods focus on single stage monitoring without considering the multistage scenario. In this paper we attempt to offer comprehensive references and a bibliography of statistical control methods for multistage manufacturing and service operations; evaluations with respect to existing methods are also given along with suggestions for future research topics.

Supplementary Material: on Nonparametric Statistical Process Control of Univariate Processes

On nonparametric statistical process control of univariate processes

Some perspectives on nonparametric statistical process control

Distribution-free monitoring of univariate processes

Statistical Process Control Using A Dynamic Sampling Scheme

Motivation for Multivariate Statistical Process Control

Performance Monitoring of Chemical Process Based on Multivariable Statistical Technology

Statistical Monitoring of Complex Multivariate Processes : with Applications in Industrial Process Control

SVM-based Multivariate Statistical Process Control Method and Its Application

Process monitoring and fault detection based on multivariate statistical projection analysis

Multivariate Statistical Process Monitoring and Control: Recent Developments and Applications to Chemical Industry

Investigation of Dynamic Multivariate Chemical Process Monitoring

Control chart for monitoring multivariate COM-Poisson attributes

Fault Detection and Isolation of Non-Gaussian and Nonlinear Processes Based on Statistics Pattern Analysis and the K-Nearest Neighbor Method

An Approach to Statistical Process Control that is New, Nonparametric, Simple, and Powerful

A Distribution-Free Method for Process Monitoring

Statistical Process Control of Over-Dispersed Multivariate Count Data

SPC Monitoring of MMSE- and Pi-Controlled Processes

A Multivariate Sign Chart for Monitoring Process Shape Parameters

Semiconductor Manufacturing Process Monitoring Based on Adaptive Substatistical PCA

Statistical Process Control for Multistage Manufacturing and Service Operations: A Review