Segmentation and Detection of Industrial Surface Defect Based on Deep Neural Network

Yi Hou,Songrong Qian
2023-01-01
Abstract:In the manufacturing of industrial products, traditional methods of surface inspection do not meet the increasing quality standards in manufacturing. In this paper, first, we propose a lightweight convolutional neural network framework for the detection of subtle surface defects using deep neural network algorithms. The detection framework consists of two stages: pixel-based defect segmentation and defect classification, where the defect segmentation algorithm segments and extracts the defect-containing areas of an industrial image, and the defect classification algorithm predicts whether the image contains defects based on the results of the previous segmentation. Then, we improved the You Only Look Once (YOLO) algorithm for industrial surface defect detection. The improved algorithm, defined as DR-YOLO, identifies defects and their approximate locations from multi-target images. Subsequently, we use data augmentation to address the problems of small sample size and uneven distribution. The experimental results show that our method outperforms other detection algorithms in terms of evaluation metrics, as well as being more advantageous in terms of rapidity of detection, and the results of defect segmentation are close to industrial reality.
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