Abstract:Actively tunable ultrafast broadband terahertz (THz) polarimetry using a reconfigurable phase-change material holds great potentials and prospects for the achievement of next-generation versatile integrated THz components and systems in a variety of THz applications. Here, an optically tunable ultrafast broadband THz polarimetric device (THz-PoD) composed of a phase-change material Ge2Sb2Te5 (GST) and a thin mica substrate is demonstrated. This proposed novel THz-PoD is verified for a frequency range of 0.1-2.5 THz, exhibiting broadband and ultrafast determination of polarization states for linearly polarized THz waves at polarization angles from -90 degrees to 90 degrees. It is shown that optical excitation with ns pulses allows easy and efficient control of the polarimetric properties of such THz-PoD. The essential role of the GST film in switching the phase transition between the amorphous and crystalline phases is emphasized by the theoretical investigation of the optically tunable ultrafast polarimetric mechanism of the device. This phase transition allows optically changing the THz-PoD's properties by ns-pulsed laser in a controlled way to achieve THz polarimetry for linearly polarized THz waves. The combined advantages of this strategy can open up a new and promising way for realizing versatile reconfigurable and integrated THz devices, which may further promote the development of novel THz systems and applications. A novel strategy is proposed for an optically reconfigurable THz polarimetric device based on a phase-change material, which is capable of measuring a wide range of polarization angles with ns switching speed. This concept provides a novel solution to next-generation integrated THz components and systems with polarimetry and control of THz waves for THz applications. image

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