Nanometrology and Nanocharacterization: Keys to the Advancement of Nanotechnology [guest Editorial]

Guangyong Li,Zuobin Wang
DOI: https://doi.org/10.1109/mnano.2020.3037438
2021-01-01
IEEE Nanotechnology Magazine
Abstract:The papers in this special section focus on nanometrology and nanocharacterization. Nanotechnology involves the development and processing of materials and systems at nanoscale. Therefore, direct observation and the characterization of materials and systems at nanoscale is of critical importance in nanotechnology. Nanometrology is concerned with the science of measurements and characterization at nanoscale. The main research in this field 1) develops or creates new measurement techniques that are able to image nanomaterials and nanodevices and 2) measures the physical parameters of nanomaterials and nanodevices, such as length or size, force, mass, electrical, magnetic, and other properties. Nanocharacterization involves the theoretical and practical aspects of using nanometrological instruments to characterize the physical properties of nanomaterials, nanostructures, nanodevices, and nanosystems at nanoscale resolution. Therefore, nanometrology and nanocharacterization play crucial roles in the advancement of nanoscience and nanotechnology.
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