A New Definition of Laser Damage Threshold of Optical Thin Films: Optical Breakdown Threshold

NI Xiao-wu,Jian Lü,HE An-zhi,Zi Ma,Jiu-Ling Zhou
DOI: https://doi.org/10.1016/0042-207x(91)91450-3
IF: 4
1991-01-01
Vacuum
Abstract:Photothermal displacement microscopy is used for the detection of μm-sized defects in Al2O3/SiO2 multilayer coatings highly reflective for 248 nm. It is shown that for high quality coatings the global (averaged over several cm2) laser-induced damage threshold for coatings of different quality is determined by the density and absorption strength of the light absorbing defects. This is confirmed by a measurement of local (averaged over 0.01 mm2) damage thresholds with the pulsed photoacoustic mkage technique allowing a dkect correlation of local damage with photothermally detected thin film defects. An analysis of laser-damaged spots reveals damage-craters of 13 μm diameter at the onset of detrimental irradiation effects. The formation of these craters is explained by a thermoelastic model describing the tensile stress in the film system resulting from evaporation of a defect located at the interface between thin film and substrate.
What problem does this paper attempt to address?