Accurate and Efficient Loss Characterization Method of 3-Level NPC Switching Arms Based on H-bridge Testing Circuit

Yuli Feng,Yiming Wang,Po Xu,Jiaqi Cao,Guanyu Lu,Ke Ma
DOI: https://doi.org/10.1109/pedg56097.2023.10215273
2023-01-01
Abstract:Three-level neutral point clamped arms (3L-NPC arms) are widely applied to power electronic converters, and their switching loss characterization is crucial for the reliability evaluation of the converters system. The widely used double-pulse testing (DPT) method is inaccurate and inefficient in extracting switching losses of 3L-NPC arms, because the parasitic parameters of DPT circuit are different from the practical 3L-NPC inverters, and only one device can be tested at a time. In this paper, a novel loss characterization method of 3L-NPC switching arms based on H-bridge testing circuit is proposed to solve the problems. The proposed testing circuit is closer to 3L-NPC inverters in practical use and can test multiple chips at one testing period. Simulation results validate the feasibility of the proposed testing method.
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