Abstract:For modern SoC systems, stringent requirements on on-chip clock generators include low area, low power consumption, environmental insensitivity, and the lowest possible jitter performance. Multiplying Delay-Locked Loop (MDLL) [1-2], subharmonically injection-locked techniques [3], and sub-sampling techniques [4-5] can significantly improve the random jitter characteristics of a clock generator. However, in order to guarantee their correct operation and optimal performance over process-voltage-temperature (PVT) variations, each method requires additional calibration circuits, which impose difficult-to-meet timing constraints. In the case of an injection-locked PLL (IL-PLL), a free-running frequency calibration is required. However, the output of an injection-locked oscillator is always fixed at the desired frequency, so a shift in the free-running frequency (e.g. caused by temperature and voltage variations) cannot be simply compensated for by using a frequency-locked loop (FLL). Therefore, we propose the use of a dual-loop topology with one free-running voltage-controlled oscillator (VCO) as a replica VCO placed inside a FLL for tracking temperature and voltage drift. The other VCO (the main VCO) is injection locked for producing a low-jitter clock, while the free-running frequency shift can be compensated for by the replica loop. The method provides robust output over temperature and voltage variations.

A High-precision Delay Locked Loop with Current Mismatch Calibration in 40nm CMOS

A High Swing Charge Pump with Current Mismatch Reduction for PLL Applications

Modeling of a 14-bit, 100-MS/s pipelined ADC with digital nonlinearity calibration

A Perfectly Current Matched Charge Pump with Wide Dynamic Range for Ultra Low Voltage Applications

A Maximum-Likelihood-Estimation-Based Digital Background Calibration Technique for Interstage Gain Error in Pipelined ADCs

A Charge Pump with Perfect Current Matching Applied to Phase-Locked Loop in 65nm CMOS.

A Calibration Scheme for a 800-Ms/s 14 Bit Pipelined ADC in 28-Nm CMOS

Digital Static Calibration Technology Used for 400MSPS, 16-Bit DAC

A 0.6V High-Swing Gate-Switching Charge Pump for PLL with Current Self-Matching Technique in 28nm CMOS

A Low Mismatch Current Charge Pump Applied to Phase-Locked Loops

A Design of Current Mismatch Compensation for Sub-Sampling Charge Pump Circuits

A Digital Calibration for High-Resolution Current Steering DAC

A 0.025% DC Current Mismatch Charge Pump for PLL Applications.

A Low-Power Area-Efficient Wide-Range Offset Calibration Technique for High-Speed High-Resolution Comparator

A Wide-Range and High-Precision Real-Time Calibration for Dynamic Comparator

A 0.022mm2 970µw Dual-Loop Injection-Locked PLL with −243db FOM Using Synthesizable All-Digital PVT Calibration Circuits

A 14-Bit 500-Ms/s DAC with Digital Background Calibration

A Novel Calibration Technique Applying to an Adaptive-Bandwidth PLL

A Charge Pump with Reduced Current Variation and Mismatch in Low-Voltage Low-Power PLLs

A Low Jitter Current-Mode Multiplying Delay-Locked Loop Applied to High-Precision TDC

Dynamic Mismatch Compensation (Dmc) Algorithm For Amplitude And Timing Errors In Current-Steering Dacs