A review of intentional electromagnetic interference in power electronics: Conducted and radiated susceptibility
Huamin Jie,Zhenyu Zhao,Yu Zeng,Yongqi Chang,Fei Fan,Changdong Wang,Kye Yak See
DOI: https://doi.org/10.1049/pel2.12685
IF: 2
2024-03-15
IET Power Electronics
Abstract:This article conducts a thorough review of relevant literature as well as the electromagnetic susceptibility standards over the past two decades. Various test setups and methods are introduced, targeting the conducted susceptibility and radiated susceptibility of power electronics devices. With the advancements in Industry 4.0 and the global demand for sustainable energy, power electronics devices are emerging as pivotal components for modern industrial, transportation, and energy delivery. Ensuring the security of these devices is of paramount importance for safeguarding the reliable operation of critical systems against any threats. In recent years, the issue of intentional electromagnetic interference (IEMI) attack and their related countermeasures have gained widespread attention in both military and civilian power electronics sectors. Here, a review of IEMI in power electronics is provided. Starting from the electromagnetic compatibility standards, the test setups for evaluating the device immunity are introduced. Due to different attack modes and propagation paths, IEMI illuminations are typically categorized into conduction and radiation, where their susceptibility studies, applications, and defence strategies are discussed, respectively. Finally, the existing challenges, ongoing trends, and future topics in this field are discussed.
engineering, electrical & electronic