Degradation Trajectory Tracking of MOSFETs Based on Machine Learning and CEEMDAN

Zhaorui Li,Dongqiang Shi,Ying Zhang,Kai Li,Huazhan Gui,Feng Yuan
DOI: https://doi.org/10.1109/ICMSP58539.2023.10170830
2023-01-01
Abstract:MOSFET is one of the most popular silicon carbide power electronic devices, is widely popular in base station, energy storage, aerospace and railway scenarios. As one of the score electronic components in power electronic system, power MOSFETs degradation performance is closely related to the overall operation of power of power electronic system, which directly affects the stability and security of the system. In this work, taking the MOSFETs accelerated thermal aging datasets provided by NASA as the research project, we proposed a deep extreme learning based on CEEMDAN(complete ensemble empirical mode decomposition) with adaptive noise to simulate the degradation trend of MOSFETs. The experimental results show that the method can fit the degradation trend well on the high noise dataset.
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