Abstract:The development of a true random number generator (TRNG) based on stochastic ferroelectric polarization switching in 2D CuInP2S6 materials, is reported. The TRNG exhibits exceptional stochastic variability, surpassing conventional entropy metrics, and passes the National Institute of Standards and Technology (NIST) randomness tests. Moreover, TRNG's unclonability is demonstrated through device‐to‐device variation, providing resilience against machine learning (ML) attacks. True random number generators (TRNGs), which create cryptographically secure random bitstreams, hold great promise in addressing security concerns regarding hardware, communication, and authentication in the Internet of Things (IoT) realm. Recently, TRNGs based on nanoscale materials have gained considerable attention for avoiding conventional and predictable hardware circuitry designs that can be vulnerable to machine learning (ML) attacks. In this article, a low‐power and low‐cost TRNG developed by exploiting stochastic ferroelectric polarization switching in 2D ferroelectric CuInP2S6 (CIPS)‐based capacitive structures, is reported. The stochasticity arises from the probabilistic switching of independent electrical dipoles. The TRNG exhibits enhanced stochastic variability with near‐ideal entropy, uniformity, uniqueness, Hamming distance, and independence from autocorrelation variations. Its unclonability is systematically examined using device‐to‐device variations. The generated cryptographic bitstreams pass the National Institute of Standards and Technology (NIST) randomness tests. This nanoscale CIPS‐based TRNG is circuit‐integrable and exhibits potential for hardware security in edge devices with advanced data encryption.

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