Abstract:We present three-dimensional simulations of the image formation of microstructure in near-field optical microscopy with the three-dimensional finite-difference time-domain method (FDTD). First, we calculated the intensity distributions inside and outside and the flux densities for both the tapered and parabolic fiber probes used in near-field optical microscope and nanolithography. The calculating result shows that for different kinds of shape the intensity distributions in both probes are similar and present standing wave forms; but the amplitudes and locations of peaks of the standing waves are different from each other. The intensity outward parabolic probe is higher than that outward tapered probe. Then we computed the intensity distributions of the samples which are composed of different materials by different polarization illumination. Assuming an aperture-type probe in collection-mode near-field microscope, we compare the images produced from the sample composed of three dielectric blocks in nanometer at a distance of 25nm and 150nm, respectively, under constant-high-scanning mode along with the direction of the polarization of the illuminating light, with near-field distribution of the sample without probe. The results show that the probe disturbs the original field distribution of the sample. The received signal is different from the original field distribution of the sample. However the received signal contains high frequency information of the sample in near-field region. Due to probe-sample interaction, parts of evanescent field transform into propagation wave. Only the interaction between the probe and sample in the near field makes possible to probe the high-frequency components and achieve the super-resolution. Therefore, the detected resolution depends on an assembly of the tip size, shape of the tip, distance between tip and sample, relative position and material characteristics of both tip and sample. These results provide the basis for correct interpretation of experimental work.

Numerical Simulation of the Near-field Properties of Near-field Optical Tweezers Probe

Light Distribution Analysis of Optical Fibre Probe-Based Near-Field Optical Tweezers Using FDTD

Study on the Diffraction Properties of Nanoaperture in Near Field Optical Tweezers

Probe optimization for nano-manipulation in metal probe-based near-field optical tweezers based on FDTD simulation

Simulation for the trapping force on Mie micro-particles in optical tweezers

Nanomanipulation of Nearfield Optical Tweezers Using a Fiber Probe

Numerical Simulation Analysis of A Near-Field Optical Virtual Probe

Simulation and Experiments of Near-Field Trapping Using Metal-Coated Optical Fiber Probe

Study on the Near-Field Optical Properties of Metal-Clad Cutting-Off Fiber Probe with A Sub-Wavelength Aperture

Near-Field Optical Tweezers Based On Nsom And Afm Probes

Research on the Near-Field Distribution of Nanometric Apertures: Fiber Optic Probes and the Influence of Parameters of Metal-Coated Probes

Transmission Efficiency Analysis of Near-Field Fiber Probe Using Fdtd Simulation

Study on the Field Distribution of the Probes in Scanning Near-Field Optical Microscope Using Finite-Difference Time-Domain Calculations

Nano-Particle Manipulated with Near-Field Optical Tweezers

Numerical Simulation Of Electromagnetic Propagation In High-Data-Density Near-Field Optical Recording

Calculation of Maxwell Stress Tensor Using 3d Fdtd for Trapping Force in Near-Field Optical Tweezers

Numerical Calculation Of Optical Probe'S Polarization Characteristics

Study on Near-Field Optical Imaging Mechanism

Numerical Simulation of Evanescent Bessel Beams and Apodization of Evanescent Field in Near-Field Optical Virtual Probe

Analysis of the Nanoscale Manipulation Using Near-Field Optical Tweezers Combined with Afm Probe

Field distribution of optical fiber probe for trapping particle