Abstract:Nano-manipulation technology, as a kind of "bottom-up" tool, has exhibited an excellent capacity in the field of measurement and fabrication on the nanoscale. Although variety manipulation methods based on probes and microscopes were proposed and widely used due to locating and imaging with high resolution, the development of non-contacted schemes for these methods is still indispensable to operate small objects without damage. However, optical manipulation, especially near-field trapping, is a perfect candidate for establishing brilliant manipulation systems. This paper reports about simulations on the electric and force fields at the tips of metallic probes irradiated by polarized laser outputted coming from a scanning near-field optical microscope probe. Distributions of electric and force field at the tip of a probe have proven that the polarized laser can induce nanoscale evanescent fields with high intensity, which arouse effective force to move nanoparticles. Moreover, schemes with dual probes are also presented and discussed in this paper. Simulation results indicate that different combinations of metallic probes and polarized lasers will provide diverse near-field and corresponding optical force. With the suitable direction of probes and polarization direction, the dual probe exhibits higher trapping force and wider effective wavelength range than a single probe. So, these results give more novel and promising selections for realizing optical manipulation in experiments, so that distinguished multi-functional manipulation systems can be developed.

Simulation and Experiments of Near-Field Trapping Using Metal-Coated Optical Fiber Probe

Trapping of Nano-Particles Using a Near-Field Optical Fiber Probe

Particles Nanomanipulation by the Enhanced Evanescent Field Through A Near-Field Scanning Optical Microscopy Probe

Nanomanipulation of Nearfield Optical Tweezers Using a Fiber Probe

Nano-manipulation Performance with Enhanced Evanescent Field Close to Near-Field Optical Probes

Simulation of Near-Field Optical Manipulator Using the Combination of A Near-Field Scanning Optical Microscope Probe and an Atomic Force Microscope Metallic Probe

Nano-Particle Manipulated with Near-Field Optical Tweezers

Analysis of the Nanoscale Manipulation Using Near-Field Optical Tweezers Combined with Afm Probe

Trapping of Nanoparticles in Water by Evanescent Wave Near A Nsom Probe

Near-Field Optical Tweezers Based On Nsom And Afm Probes

Analysis of Trapping Forces Combining Near-field Optical Tweezers with AFM Probe

Simulation of Optical Nano-Manipulation with Metallic Single and Dual Probe Irradiated by Polarized Near-Field Laser

Optical Trapping Force Combining An Optical Fiber Probe And An Afm Metallic Probe

Field distribution of optical fiber probe for trapping particle

Probe optimization for nano-manipulation in metal probe-based near-field optical tweezers based on FDTD simulation

Optical Trapping and Manipulation of Nano-objects with an Apertureless Probe

Numerical Simulation of the Near-field Properties of Near-field Optical Tweezers Probe

Calculation of Maxwell Stress Tensor Using 3d Fdtd for Trapping Force in Near-Field Optical Tweezers

Dynamic Multiple Nanoparticle Trapping using Metamaterial Plasmonic Tweezers

3D manipulation with scanning near field optical nanotweezers

Design of Near-Field Optical Probes with Optimal Field Enhancement by Finite Difference Time Domain Electromagnetic Simulation