A digital CDS technique and the performance testing
Xiao-Yan Liu,Jing-Bin Lu,Yan-Ji Yang,Bo Lu,Yu-Sa Wang,Yu-Peng Xu,Wei-Wei Cui,Wei Li,Mao-Shun Li,Juan Wang,Da-Wei Han,Tian-Xiang Chen,Jia Huo,Wei Hu,Yi Zhang,Yue Zhu,Zi-Liang Zhang,Guo-He Yin,Yu Wang,Zhong-Yi Zhao,Yan-Hong Fu,Ya Zhang,Ke-Yan Ma,Yong Chen
DOI: https://doi.org/10.48550/arXiv.1410.2402
2014-10-09
Abstract:Readout noise is a critical parameter for characterizing the performance of charge-coupled devices (CCDs), which can be greatly reduced by the correlated double sampling (CDS) circuit. However, conventional CDS circuit inevitably introduces new noises since it consists of several active analog components such as operational amplifiers. This paper proposes a digital CDS circuit technique, which transforms the pre-amplified CCD signal into a train of digital presentations by a high-speed data acquisition card directly without the noisy CDS circuit first, then implement the digital CDS algorithm through numerical method. The readout noise of 3.3 e$^{-}$ and the energy resolution of 121 eV@5.9keV can be achieved via the digital CDS technique.
Instrumentation and Detectors,Nuclear Experiment