Towards a More Accurate Particle Size Distribution of Supported Catalyst by Using HAADF‐STEM
Bingsen Zhang,Wei Zhang,Dang Sheng Su
DOI: https://doi.org/10.1002/cctc.201100096
IF: 4.5
2011-01-01
ChemCatChem
Abstract:ChemCatChemVolume 3, Issue 6 p. 965-968 Communication Towards a More Accurate Particle Size Distribution of Supported Catalyst by using HAADF-STEM† Dr. Bingsen Zhang, Dr. Bingsen Zhang Department of Inorganic Chemistry, Fritz Haber Institute of the Max Planck Society, Faradayweg 4-6, 14195 Berlin (Germany), Fax: (+49) 30-8413-4401Search for more papers by this authorDr. Wei Zhang, Dr. Wei Zhang Department of Inorganic Chemistry, Fritz Haber Institute of the Max Planck Society, Faradayweg 4-6, 14195 Berlin (Germany), Fax: (+49) 30-8413-4401Search for more papers by this authorProf. Dr. Dang Sheng Su, Corresponding Author Prof. Dr. Dang Sheng Su [email protected] Department of Inorganic Chemistry, Fritz Haber Institute of the Max Planck Society, Faradayweg 4-6, 14195 Berlin (Germany), Fax: (+49) 30-8413-4401 Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Science, 72 Wenhua Road, Shenyang 110006 (China)Department of Inorganic Chemistry, Fritz Haber Institute of the Max Planck Society, Faradayweg 4-6, 14195 Berlin (Germany), Fax: (+49) 30-8413-4401Search for more papers by this author Dr. Bingsen Zhang, Dr. Bingsen Zhang Department of Inorganic Chemistry, Fritz Haber Institute of the Max Planck Society, Faradayweg 4-6, 14195 Berlin (Germany), Fax: (+49) 30-8413-4401Search for more papers by this authorDr. Wei Zhang, Dr. Wei Zhang Department of Inorganic Chemistry, Fritz Haber Institute of the Max Planck Society, Faradayweg 4-6, 14195 Berlin (Germany), Fax: (+49) 30-8413-4401Search for more papers by this authorProf. Dr. Dang Sheng Su, Corresponding Author Prof. Dr. Dang Sheng Su [email protected] Department of Inorganic Chemistry, Fritz Haber Institute of the Max Planck Society, Faradayweg 4-6, 14195 Berlin (Germany), Fax: (+49) 30-8413-4401 Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Science, 72 Wenhua Road, Shenyang 110006 (China)Department of Inorganic Chemistry, Fritz Haber Institute of the Max Planck Society, Faradayweg 4-6, 14195 Berlin (Germany), Fax: (+49) 30-8413-4401Search for more papers by this author First published: 27 May 2011 https://doi.org/10.1002/cctc.201100096Citations: 39 † HAADF-STEM: High angle annular dark field scanning transmission electron microscopy. Read the full textAboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat Graphical Abstract STEM can make a large difference: Conventionally the catalysis community has used HRTEM (figure, left) imaging to obtain the particle size distribution (PSD) of supported catalysts. Now we have found that by using the analogous HAADF-STEM (figure, right) a more accurate PSD can be calculated, which is crucial for understanding the catalysis mechanisms. Supporting Information Detailed facts of importance to specialist readers are published as ”Supporting Information”. Such documents are peer-reviewed, but not copy-edited or typeset. They are made available as submitted by the authors. Filename Description cctc_201100096_sm_miscellaneous_information.pdf1.1 MB miscellaneous_information Please note: The publisher is not responsible for the content or functionality of any supporting information supplied by the authors. Any queries (other than missing content) should be directed to the corresponding author for the article. References 1Y. Lei, F. Mehmood, S. Lee, J. Greeley, B. Lee, S. Seifert, R. E. Winans, J. W. Elam, R. J. Meyer, P. C. Redfern, D. Teschner, R. Schlögl, M. J. Pellin, L. A. Curtiss, S. Vajda, Science 2010, 328, 224–228. 2O. Lopez-Acevedo, K. A. Kacprzak, J. Akola, H. Häkkinen, Nat. Chem. 2010, 2, 329–334. 3W. E. Kaden, T. Wu, W. A. Kunkel, S. L. Anderson, Science 2009, 326, 826–829. 4K. Yamamoto, T. Imaoka, W. J. Chun, O. Enoki, H. Katoh, M. Takenaga, A. Sonoi, Nat. Chem. 2009, 1, 397–402. 5J. V. Lauritsen, J. Kibsgaard, S. Helveg, H. Topsøe, B. S. Clausen, E. Lægsgaard, F. Besenbacher, Nat. Nanotechnol. 2007, 2, 53–58. 6C. T. Campbell, S. C. Parker, D. E. Starr, Science 2002, 298, 811–814. 7A. A. Herzing, C. J. Kiely, A. F. Carley, P. Landon, G. J. Hutchings, Science 2008, 321, 1331–1335. 8A. Karim, T. Conant, A. Datye, J. Catal. 2006, 243, 420–427. 9S. R. Mukai, T. Masuda, Y. Matsuzawa, K. Hashimoto, Chem. Eng. Sci. 1998, 53, 439–448. 10A. Weibel. R. Bouchet, F. Boulc′h, P. Knauth, Chem. Mater. 2005, 17, 2378–2385. 11R. W. J. Scott, O. M. Wilson, R. M. Crooks, J. Phys. Chem. B 2005, 109, 692–704. 12N. S. Sobal, U. Ebels, H. Möhwald, M. Giersig, J. Phys. Chem. 2003, 107, 7351–7354. 13A. M. Cao, R. W. Lu, G. Veser, Phys. Chem. Chem. Phys. 2010, 12, 13499–13510. 14J. Liu, Microsc. Microanal. 2004, 10, 55–76. 15W. D. Pyrz, D. J. Buttrey, Langmuir 2008, 24, 11350–11360. 16D. Wang, A. Villa, F. Porta, D. Su, L. Prati, Chem. Commun. 2006, 1956–1958. 17C. Bock, C. Paquet, M. Couillard, G. A. Botton, B. R. MacDougall, J. Am. Chem. Soc. 2004, 126, 8028–8037. 18K. Heinemann, F. Soria, Ultramicroscopy 1986, 20, 1–14. 19Z. Li, J. Yang, L. Wang, Int. J. Polym. Anal. Charact. 2006, 11, 337–351. 20L. S. Karlsson, K. Deppert, J. O. Malm, J. Nanopart. Res. 2006, 8, 971–980. 21Y. Dieckmann, H. Cölfen, H. Hofmann, A. Petri-Fink, Anal. Chem. 2009, 81, 3889–3895. 22W. D. Pyrz, S. Park, T. Vogt, D. J. Buttrey, J. Phys. Chem. C 2007, 111, 10824–10828. 23J. Liu, J. Electron Microsc. 2005, 54, 251–278. 24K. Sun, J. Liu, N. K. Nag, N. D. Browning, J. Phys. Chem. B 2002, 106, 12239–12246. 25N. L. Okamoto, S. Mehraeen, A. Kulkarni, S. Nemana, B. C. Gates, N. D. Browning, Microsc. Microanal. 2007, 13, 546–547. 26D. Acevedo-Reyes, M. Perez, C. Verdu, A. Bogner, T. Epicier, J. Microsc. 2008, 232, 112–122. 27E. P. W. Ward, I. Arslan, A. Bleloch, J. M. Thomas, P. A. Midgley, J. Phys. Conf. Ser. 2006, 26, 207–210. 28F. Krumeich, E. Müller, R. A. Wepf, R. Nesper, J. Phys. Chem. C 2011, 115, 1080–1083. 29D. B. Williams, C. B. Carter, Transmission Electron Microscopy: A Textbook for Materials Science, Plenum Press, New York, 1996. 30S. J. Pennycook, M. F. Chisholm, A. R. Lupini, M. Varela, A. Y. Borisevich, M. P. Oxley, W. D. Luo, K. van Benthem, S. H. Oh, D. L. Sales, S. I. Molina, J. García-Barriocanal, C. Leon, J. Santamaría, S. N. Rashkeev, S. T. Pantelides, Philos. Trans. R. Soc. A 2009, 367, 3709–3733. 31W. D. Pyrz, S. Park, D. A. Blom, D. J. Buttrey, T. Vogt, J. Phys. Chem. C 2010, 114, 2538–2543. 32R. E. Lakis, C. E. Lyman, H. G. Stenger, Jr., J. Catal. 1995, 154, 261–275. 33K. Y. Ho, K. L. Yeung, J. Catal. 2006, 242, 131–141. 34O. Scherzer, J. Appl. Phys. 1949, 20, 20–29. 35W. Zhang, A. Trunschke, R. Schlögl, D. Su, Angew. Chem. 2010, 122, 6220–6225; Angew. Chem. Int. Ed. 2010, 49, 6084–6089. 36W. K. Hsieh, F. R. Chen, J. J. Kai, A. I. Kirkland, Ultramicroscopy 2004, 98, 99–114. 37K. Arve, H. Kannisto, H. H. Ingelsten, K. Eränen, M. Skoglundh, D. Y. Murzin, Catal. Lett. 2011, DOI: . Citing Literature Volume3, Issue6Special Issue: Advanced MicroscopyJune 14, 2011Pages 965-968 ReferencesRelatedInformation