4D Atomic Electron Tomography

Jianwei Miao,Jihan Zhou,Yongsoo Yang,Yao Yang,Dennis S. Kim,Andrew Yuan,Xuezeng Tian,Colin Ophus,Fan Sun,Andreas K. Schmid,Michael Nathanson,Hendrik Heinz,Qi An,Hao Zeng,Peter Ercius

DOI: https://doi.org/10.1017/s1431927619009802

IF: 4.0991

2019-01-01

Microscopy and Microanalysis

Abstract:Journal Article 4D Atomic Electron Tomography Get access Jianwei Miao, Jianwei Miao Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA Corresponding author: miao@physics.ucla.edu Search for other works by this author on: Oxford Academic Google Scholar Jihan Zhou, Jihan Zhou Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Yongsoo Yang, Yongsoo Yang Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Yao Yang, Yao Yang Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Dennis S Kim, Dennis S Kim Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Andrew Yuan, Andrew Yuan Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Xuezeng Tian, Xuezeng Tian Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Colin Ophus, Colin Ophus National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Fan Sun, Fan Sun Department of Physics, University at Buffalo, the State University of New York, Buffalo, NY, USA Search for other works by this author on: Oxford Academic Google Scholar Andreas K Schmid, Andreas K Schmid National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA Search for other works by this author on: Oxford Academic Google Scholar ... Show more Michael Nathanson, Michael Nathanson Department of Chemical and Biological Engineering, University of Colorado at Boulder, Boulder, CO, USA Search for other works by this author on: Oxford Academic Google Scholar Hendrik Heinz, Hendrik Heinz Department of Chemical and Biological Engineering, University of Colorado at Boulder, Boulder, CO, USA Search for other works by this author on: Oxford Academic Google Scholar Qi An, Qi An Chemical and Materials Engineering, University of Nevada, Reno, NV, USA Search for other works by this author on: Oxford Academic Google Scholar Hao Zeng, Hao Zeng Department of Physics, University at Buffalo, the State University of New York, Buffalo, NY, USA Search for other works by this author on: Oxford Academic Google Scholar Peter Ercius Peter Ercius National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 1814–1815, https://doi.org/10.1017/S1431927619009802 Published: 01 August 2019