A Transportable Rydberg Atomic Microwave Electrometry

Bian Wu,Zheng Shunyuan,Li Zhongqi,Guo Zhongyu,Ma Hengkuan,Qiu Siyuan,Liao Kaiyu,Zhang Xinding,Yan Hui
DOI: https://doi.org/10.3788/LOP230671
2023-01-01
Laser & Optoelectronics Progress
Abstract:The research of the microwave electrical field measurement which is based on the Rydberg atoms is developing fast during recent years. The prerequisite for the engineering application is the minimization and integration of the microwave electrical field measurement systems. This article introduces the basic characteristics of the Rydberg atoms, the fundamental principles of the microwave electrical field measurement, and the method of determining the resonant frequency of the transition. In addition, a transportable Rydberg atomic microwave electrometry is developed by combing the 852 nm modulation transfer frequency stabilization and 509 nm electromagnetically induced transparency frequency stabilization. Based on this instrument, we demonstrate the microwave electrical field measurement which is traced back to the standard international unit systems and the detection of the weak microwave signal.
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