Span Shift and Extension of Quantum Microwave Electrometry with Rydberg Atoms Dressed by an Auxiliary Microwave Field

Feng-Dong Jia,Xiu-Bin Liu,Jiong Mei,Yong-Hong Yu,Huai-Yu Zhang,Zhao-Qing Lin,Hai-Yue Dong,Jian Zhang,Feng Xie,Zhi-Ping Zhong
DOI: https://doi.org/10.1103/physreva.103.063113
IF: 2.971
2021-01-01
Physical Review A
Abstract:The Rydberg electromagnetically induced transparency (EIT)-Autler Townes (AT) splitting proportional to the target microwave electric field strength is an atom-based primary traceable standard in microwave electrometry. The minimum detected microwave electric field is limited when the EIT-AT splitting is indistinguishable. We design a method for auxiliary microwave-dressed Rydberg atoms that extends the electrometric span. We theoretically and experimentally show that the low bound of the direct SI-traceable microwave electric field is extended by two orders of magnitude, which is from several mV/cm to mu V/cm in a room-temperate Rb cell with a modest setup.
What problem does this paper attempt to address?