Microwave Dielectric Properties of Ba 5+ N Ti N Nb 4 O 15+3 N Ceramics

Liang Fang,L. Chen,Hui Zhang,X. K. Hong,C. L. Diao,H. X. Liu
DOI: https://doi.org/10.1007/s10854-005-6594-5
2005-01-01
Journal of Materials Science Materials in Electronics
Abstract:New dielectric ceramics Ba 5 + n Ti n Nb 4 O 15 + 3 n ( n = 1,2,3) with cation-deficient hexagonal perovskite-related structure were prepared by the conventional solid-state reaction route. The phase and structure of the ceramics were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM). The microwave dielectric properties of the ceramics were studied using a network analyzer. These ceramics show dielectric constant (ε r ) of in the range of 45.1–48.6, τ f in the range +59 to +175 ppm°C − 1 , and high quality factors with Q × f values up to 22882. The values of ε r and τ f of the ceramics gradually increase as the number of n increases.
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