Response to “comment on ‘thickness and Angular Dependencies of Exchange Bias in Ferromagnetic/antiferromagnetic Bilayers’ [J. Appl. Phys. 92, 1009 (2002)] and ‘thickness Dependence of Exchange Bias and Coercivity in a Ferromagnetic Layer Coupled with an Antiferromagnetic Layer’ [J. Appl. Phys. 94, 2529 (2003)]”

Jing-guo Hu,Guo-jun Jin,Yu-qiang Ma
DOI: https://doi.org/10.1063/1.1767964
IF: 2.877
2004-01-01
Journal of Applied Physics
Abstract:The approach of using the generalized Meiklejohn-Bean model to derive the antiferromagnetic thickness dependence of exchange bias and coercivity in ferromagnetic/antiferromagnetic bilayers is justified. The mathematical procedure to obtain the analytical expressions through finding the critical fields is illuminated.
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