A Self-Heating-Followed Non-Uniformity Calibration Circuit for Silicon Diode Uncooled IRFPA

Ye Zhou,Siyuan Ye,Wengao Lu,Dunshan Yu,Yacong Zhang,Zhongjian Chen
DOI: https://doi.org/10.1109/icsict55466.2022.9963403
2022-01-01
Abstract:This paper presents a self-heating-followed non-uniformity calibration (NUC) circuit for silicon diode uncooled infrared focal plane arrays (IRFPA). The proposed NUC voltage generator provides larger charge/discharge current to the successive capacitance load without increasing power consumption. The proposed NUC circuit achieves smaller settling time and lower noise, which improves the accuracy of the calibration process. For verification, a 6-bit NUC circuit for 640×480 silicon diode uncooled IRFPA has been designed in the 0.18μm CMOS technology. When driving a total capacitance load of 40nF, the settling time, output-referred RMS noise and power consumption of the NUC circuit is 7.74μs, 0.364μV, 2.4mW, respectively.
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