Ultrahigh Current and Ultralow Power Dissipation of Janus Monolayer Iiia-Via Ga2xy Mosfets

Xueping Li,Tongtong Li,Peize Yuan,Lin Li,Chenhai Shen,Yurong Jiang,Xiaohui Song,Congxin Xia
DOI: https://doi.org/10.1016/j.apsusc.2023.157436
2023-01-01
Abstract:With the advances of two-dimensional semiconductors, it is promising for the miniaturization of highly inte-grated circuits. However, the high leakage current, small on-state current and unnecessary power consumption hinder the development of high-performance nanodevices. Here, we design sub-5-nm double-gate monolayer Ga2XY (X, Y = S, Se and Te) metal-oxidesemiconductor field-effect transistors. For all the designed devices, the on-state current, intrinsic delay time and power delay product can meet the standard of the International Technology Roadmap for Semiconductor in 2028. Additionally, the devices based on large bandgap materials have strong inhibition effect on leakage current. In particular, the Ga2SSe device has optimized subthreshold swing as low as 60.7 mV/dec and Ion of 5082 mu A/mu m (about 6 times higher than the high-performance re-quirements). The extremely low energy-delay product of 3.64 x 10-31 Js/mu m is obtained for the Ga2SeTe device. Therefore, monolayer Ga2XY can be expected for the application of next-generation high-performance electronic nanodevices.
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