EDS analysis on effect of low dosage gamma radiation and micromechanical properties of SnAg3Cu0.5 solder
Nur Farisa Nadia Mohmad Lehan,Wan Yusmawati Wan Yusoff,Normidatul Salwa Sobri,Ku Zarina Ku Ahmad,Mohamad Faizal Abdullah,Azuraida Amat,Azman Jalar,Irman Abdul Rahman,Emee Marina Salleh
DOI: https://doi.org/10.1007/s10854-021-07617-4
2022-01-23
Abstract:Electronic applications are now driving packaging technology that is equivalent to primary computer packages for the past 25 years. The electronic application currently shows an ascending market demand due to rapid development of smart and wireless component with mixed technologies that include digital microprocessors. In ensuring the quality of the devices, the reliability of the solder joint is very vital. Attributable to their common uses, radiation particles including gamma ray is considered as one of the primary factors that could degrade the performance of the electronic devices. Thus, in this study, both mechanical and microstructure properties of lead-free solder joints radiated with gamma were investigated. Prior to the evaluation, the solder pastes of tin–silver–copper (SnAg3Cu0.5; SAC305) was manually deposited on the printed circuit board using a stencil printing method and reflow soldering process. Subsequently, the solder was exposed to low doses of gamma radiation. The current finding showed that as the radiation dose increased, the solder sample became softer and more plastic. FESEM and EDS analysis signified that intermetallic layer in the tin (Sn) matrix was dominated by Cu6Sn5 and Ag2Sn compound. According to micromechanical investigation, both hardness and reduced modulus of the solder decreased with increasing the radiation dose that was due to microstructure change and the formation of voids.
engineering, electrical & electronic,materials science, multidisciplinary,physics, condensed matter, applied